IRPS

Keyphrases

Publications

2024

Subrat Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, A. Sharma, G. Mirabeli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert
Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation. IRPS (2024)
Tommaso Rollo, Hansel Lo, Luca Larcher, Christopher Olsen, Milan Pesic
Blocking Oxide Material Engineering to Improve Retention Loss in 3D NAND: a Modeling Process Optimization Study. IRPS (2024)
M. Kang, M. Chang, Y. Park, C. Noh, S. H. Hong, B. Park, Y. H. Park, Y. C. Jung, W. S. Lim, G. H. Kim, Y. Lee, H. Yang, D. Shin, J. G. Yang, K. H. Cho, W. C. Jeong, H.-J. Cho, Wook-Hyeon Kwon, D. W. Kim, K. Rim, J. H. Song
Device Design and Reliability of GAA MBCFET. IRPS (2024)
Devanarayanan Ettisserry, Angelo Visconti, Mauro Bonanomi, Riccardo Pazzocco, Andrea Locatelli, Alessandro Sebastiani, Ashonita Chavan, Matthew Hollander, Giorgio Servalli, Alessandro Calderoni, Nirmal Ramaswamy
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. IRPS (2024)
Longda Zhou, Jie Li, Pengpeng Ren, Sheng Ye, Da Wang, Zheng Qiao, Zhigang Ji
Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM. IRPS (2024)
M. Boito, Manuel Fregolent, Carlo De Santi, A. Abbisogni, S. Smerzi, Isabella Rossetto, Ferdinando Iucolano, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes Investigated by a Novel Experimental Approach. IRPS (2024)
J. P. Bastos, Barry J. O'Sullivan, Yusuke Higashi, Adrian Vaisman Chasin, Jacopo Franco, Hiroaki Arimura, J. Ganguly, Elena Capogreco, Alessio Spessot, N. Horiguchi
Side and Corner Region Non-Uniformities in Grown SiO2 and Their Implications on Current, Capacitance and Breakdown Characteristics. IRPS (2024)
Ruofei Hu, Jianshi Tang, Yue Xi, Zhixing Jiang, Yuyao Lu, Chengxiang Ma, Junchen Li, Bin Gao, He Qian, Huaqiang Wu
Statistical Modeling of Time-Dependent Post-Programming Conductance Drift in Analog RRAM. IRPS (2024)
Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED. IRPS (2024)
Rajarshi Roy Chaudhuri, Vipin Joshi, Saniya S. Wani, Simran R. Karthik, Rasik Rashid Malik, Mayank Shrivastava
Experimental Insights into the Role of Inter-valley and Defect Transitions of Hot Electrons in Determining Self-heating in AlGaN/GaN HEMTs. IRPS (2024)
Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. IRPS (2024)
Mitesh Goyal, Mukesh Chaturvedi, Raju Kumar, Mahesh Vaidya, Mayank Shrivastava
Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. IRPS (2024)
Dishant Sangani, Ben Kaczer, Pieter Weckx, Philippe J. Roussel, Subrat Mishra, Erik Jan Marinissen, Georges G. E. Gielen
Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers. IRPS (2024)
Ernest Y. Wu, Brian T. McGowan, Ronald Bolam, Huai Huang, Huimei Zhou, Miaomiao Wang
A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction. IRPS (2024)
Robert W. Herrick
Reliability testing for silicon photonics and optoelectronics (Invited). IRPS (2024)
Md. Asaduz Zaman Mamun, Nathan J. Conrad, Saeed Mohammadi, Muhammad Ashraful Alam
Validating Supply Chain against Recycled COTS ICs using I/O Pad Transistors: A Zero-Area Intrinsic Odometer Approach. IRPS (2024)
Jeremy Dunworth, Jefy Alex Jayamon, Peter M. Asbeck, Gabriel M. Rebeiz
Reliability Considerations for 5G and 6G Phased Arrays. IRPS (2024)
Karansingh Thakor, Payel Chatterjee, Souvik Mahapatra
A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions. IRPS (2024)
Tianhao Zhang, Norman Chang
Design for Reliability (DFR) Aware EDA Solution for Product Reliability (Invited). IRPS (2024)
B. D. Rummel, C. E. Glaser, R. T. Gurule, M. Groves, A. T. Binder, R. Floyd, L. Yates, K. J. Reilly, R. J. Kaplar
TRB Testing. IRPS (2024)
Zirui Wang, Haoran Wang, Yuxiao Wang, Zixuan Sun, Lang Zeng, Runsheng Wang, Ru Huang
New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature. IRPS (2024)
J. Laguerre, Simon Martin, Jean Coignus, Catherine Carabasse, Marc Bocquet, François Andrieu, Laurent Grenouillet
Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays. IRPS (2024)
Pramoda Vishnumurthy, Ruben Alcala, Thomas Mikolajick, Uwe Schroeder, Luis Azevedo Antunes, Alfred Kersch
Ferroelectric HfO2-based Capacitors for FeRAM: Reliability from Field Cycling Endurance to Retention (invited). IRPS (2024)
H. C. Chang, P. J. Liao, S. H. Chen, Y. K. Chang, C. P. Li, W. C. Liao, M. H. Hsieh, H. W. Yang, J. H. Lee, C. M. Huang, Jun He
Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. IRPS (2024)
Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, S. Pae
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology. IRPS (2024)
Y. Guo, R. Degraeve, Michiel Vandemaele, Pablo Saraza-Canflanca, Jacopo Franco, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
Exploiting Bias Temperature Instability for Reservoir Computing in Edge Artificial Intelligence Applications. IRPS (2024)
Minki Cho, Balkaran Gill, Rahul Sharma, Shiv Gupta
Adaptive Clock Gating for Improving Wear out induced Duty Cycle Shift in the Clock Network. IRPS (2024)
Ricardo Ascázubi, F. Rogelio Palomo, José Manuel Quesada, Miguel Antonio Cortes-Giraldo, Jose Antonio Pavón-Rodriguez
Neutron and Laser Irradiation of Si and Ge Diodes. IRPS (2024)
Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch
Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction. IRPS (2024)
Suman Gora, Jay Singh, Mandeep Jangra, Arnab Datta
Impact of Edge and Basal Plane Oxidation on the Stability of Oxygen Doped MoS2- RRAM. IRPS (2024)
D. Tiernc, Antonio Arreghini, Alicja Lesniewska, Y. Jeong, Marleen H. van der Veen, J. Stiers, N. Bazzazian, Ivan Ciofi, Geert Van den Bosch, Maarten Rosmeulen
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND. IRPS (2024)
Ayan K. Biswas, Daniel J. Lichtenwalner, Jae-Hyung Park, Brett Hull, Satyaki Ganguly, Donald A. Gajewski, Elif Balkas
Hole-Induced Threshold Voltage Instability Under High Positive and Negative Gate Stress in SiC MOSFETs. IRPS (2024)
Rupali Verma, Utpreksh Patbhaje, Asif Altaf Shah, Jeevesh Kumar, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Mayank Shrivastava
Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs. IRPS (2024)
Ernest Y. Wu, Takashi Ando, Paul Jamison
General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition. IRPS (2024)
Soumitra Joy, Kaustubh Joshi, Ahmad Zubair, Samuel Bader, Jason Peck, Michael Beumer, Pratik Koirala, Marko Radosavljevic, Heli Vora, Inanc Meric, Han Wui Then
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors. IRPS (2024)
S. Musibau, N. Poumpouridis, Artemisia Tsiara, J. Franco, Mathias Berciano, Joris Van Campenhout, I. De Wout, K. Crees
Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors. IRPS (2024)
Wei Chun Wang, Shida Zhang, Sudarshan Sharma, Minah Lee, Saibal Mukhopadhyay
Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS. IRPS (2024)
Jeevesh Kumar, Aadil Bashir Dar, Asif A. Shah, K. M. Amogh, Sumana Chattaraj, Utpreksh Patbhaje, Anand Kumar Rai, Rupali Verma, Mayank Shrivastava
Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders. IRPS (2024)
Ilho Myeong, Suhwan Lim, Taeyoung Kim, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Munkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Ilyounz Yoon, Jaeho Kim, Kwangsoo Kim, Kwangmin Park, Bong Jin Kuh, Wanki Kim, Daewon Ha, Sujin Ahn, Jaihyuk Song, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Jinseong Heo
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND. IRPS (2024)
Priyankka Gundlapudi Ravikumar, Prasanna Venkatesan Ravindran, Khandker Akif Aabrar, Taeyoung Song, Sharadindu Gopal Kirtania, Dipjyoti Das, Chinsung Park, Nashrah Afroze, Mengkun Tian, Shimeng Yu, Ahmad Ehtesham Islam, Suman Datta, Souvik Mahapatra, Asif Islam Khan
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions. IRPS (2024)
Kozo Takeuchi, Takashi Kato, Masanori Hashimoto
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs. IRPS (2024)
Po-Hao Tseng, Yu-Hsuan Lin, Feng-Min Lee, Tian-Cig Bo, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Keh-Chung Wang, Chih-Yuan Lu
Reliability Assessment for an In-3D-NAND Approximate Searching Solution. IRPS (2024)
Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Aadil Bashir Dar, Mayank Shrivastava
Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs. IRPS (2024)
Limeng Shi, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori
Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs. IRPS (2024)
Shuying Wang, Yewei Zhang, Yunjoong Kim, Pengpeng Ren, Zhigang Ji
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect. IRPS (2024)
Taras Ravsher, Robin Degraeve, Daniele Garbin, Sergiu Clima, Andrea Fantini, Gabriele Luca Donadio, Shreya Kundu, Wouter Devulder, Hubert Hody, Goedele Potoms, Jan Van Houdt, Valeri Afanas'ev, Attilio Belmonte, Gouri Sankar Kar
Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory. IRPS (2024)
Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS (2024)
En Xia Zhang, Shintaro Toguchi, Zi Xiang Guo, Michael L. Alles, Ronald D. Schrimpf, Daniel M. Fleetwood
Charge Trapping in Irradiated 3D Devices and ICs (Invited). IRPS (2024)
Sangmin Oh, Taeyoung Jeong, Junghwan Yum, Minhyuk Lim, Yoohwan Kim, Bongyong Jeong, Jeongmin Jo, Hyewon Shim, Shin-Young Chung, Paul Jung
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. IRPS (2024)
Yinghong Zhao, Hokyung Park, Ki-Don Lee, Liangshan Chen, Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim, Myungsoo Yeo, Shin-Young Chung, Ju Kwang Kim
Impacts of Post-Cu CMP Queue Time on Reliability. IRPS (2024)