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Shin-Young Chung
Publication Activity (10 Years)
Years Active: 2019-2023
Publications (10 Years): 9
Top Topics
E Learning
Fault Isolation
Semiconductor Devices
Predicate Logic
Top Venues
IRPS
ISOCC
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Publications
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Manisha Sharma
,
Hokyung Park
,
Yinghong Zhao
,
Ki-Don Lee
,
Liangshan Chen
,
Joonah Yoon
,
Rakesh Ranjan
,
Caleb Dongkyan Kwon
,
Hyewon Shim
,
Myungsoo Yeo
,
Shin-Young Chung
,
Jon Haefner
Polarity Dependency of MOL-TDDB in FinFET.
IRPS
(2023)
SungMan Rhee
,
Hyunjin Kim
,
Sangku Park
,
Taiki Uemura
,
Yuchul Hwang
,
Seungjin Choo
,
Jinju Kim
,
Hwasung Rhee
,
Shin-Young Chung
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
IRPS
(2023)
Seongkyung Kim
,
Hyerim Park
,
Eunyu Choi
,
Young Han Kim
,
Dahyub Kim
,
Hyewon Shim
,
Shin-Young Chung
,
Paul Jung
Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs.
IRPS
(2023)
Rakesh Ranjan
,
Pavitra Ramadevi Perepa
,
Ki-Don Lee
,
Hokyung Park
,
Peter Kim
,
Ganesh Chakravarthy Yerubandi
,
Jon Haefner
,
Caleb Dongkyun Kwon
,
Minjung Jin
,
Wenhao Zhou
,
Hyewon Shim
,
Shin-Young Chung
Impact of Barrier Metal Thickness on SRAM Reliability.
IRPS
(2023)
Taiki Uemura
,
Byungjin Chung
,
Shin-Young Chung
,
Seungbae Lee
,
Yuchul Hwang
,
Sangwoo Pae
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM.
IRPS
(2023)
Seongkyung Kim
,
Ukjin Jung
,
Seungjin Choo
,
Kihyun Choi
,
Tae-Jin Chung
,
Shin-Young Chung
,
Euncheol Lee
,
Juhun Park
,
Deokhan Bae
,
Myungyoon Um
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
IRPS
(2022)
Taiki Uemura
,
Byungjin Chung
,
Jegon Kim
,
Hyewon Shim
,
Shin-Young Chung
,
Brandon Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.
IRPS
(2022)
Taiki Uemura
,
Byungjin Chung
,
Jegon Kim
,
Hyewon Shim
,
Shin-Young Chung
,
Brandon Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
IRPS
(2022)
Ghil-Geun Oh
,
Jong-Ho Eun
,
Shin-Young Chung
,
Brandon Lee
Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method.
ISOCC
(2019)