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Seungjin Choo
Publication Activity (10 Years)
Years Active: 2015-2023
Publications (10 Years): 4
Top Topics
Predictive Model
Machine Learning
Reliability Analysis
Skin Cancer
Top Venues
IRPS
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Publications
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SungMan Rhee
,
Hyunjin Kim
,
Sangku Park
,
Taiki Uemura
,
Yuchul Hwang
,
Seungjin Choo
,
Jinju Kim
,
Hwasung Rhee
,
Shin-Young Chung
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
IRPS
(2023)
Seongkyung Kim
,
Ukjin Jung
,
Seungjin Choo
,
Kihyun Choi
,
Tae-Jin Chung
,
Shin-Young Chung
,
Euncheol Lee
,
Juhun Park
,
Deokhan Bae
,
Myungyoon Um
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
IRPS
(2022)
Md Iqbal Mahmud
,
Rakesh Ranjan
,
Ki-Don Lee
,
Pavitra Ramadevi Perepa
,
Caleb Dongkyun Kwon
,
Seungjin Choo
,
Kihyun Choi
Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET.
IRPS
(2022)
Hyun-Chul Sagong
,
Hyunjin Kim
,
Seungjin Choo
,
Sungyoung Yoon
,
Hyewon Shim
,
Sangsu Ha
,
Tae-Young Jeong
,
Minhyeok Choe
,
Junekyun Park
,
Sangchul Shin
,
Sangwoo Pae
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.
IRPS
(2018)
Changze Liu
,
Hyun-Chul Sagong
,
Hyejin Kim
,
Seungjin Choo
,
Hyunwoo Lee
,
Yoohwan Kim
,
Hyunjin Kim
,
Bisung Jo
,
Minjung Jin
,
Jinjoo Kim
,
Sangsu Ha
,
Sangwoo Pae
,
Jongwoo Park
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.
IRPS
(2015)