Sangsu Ha

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 1

Top Topics

Workflow Technology

Highly Reliable

Embedded Systems

Top Venues

Publications

Hyun-Chul Sagong, Hyunjin Kim, Seungjin Choo, Sungyoung Yoon, Hyewon Shim, Sangsu Ha, Tae-Young Jeong, Minhyeok Choe, Junekyun Park, Sangchul Shin, Sangwoo Pae
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology. IRPS (2018)
Hyunsuk Chun, In Hak Baick, Sangsu Ha, Eunmi Kwon, Seungbae Lee, Seil Kim, Sangwoo Pae, Jongwoo Park
CPI reliability and EMI benefit for MIM CAP embedded C4 package. IRPS (2015)
Changze Liu, Hyun-Chul Sagong, Hyejin Kim, Seungjin Choo, Hyunwoo Lee, Yoohwan Kim, Hyunjin Kim, Bisung Jo, Minjung Jin, Jinjoo Kim, Sangsu Ha, Sangwoo Pae, Jongwoo Park
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. IRPS (2015)
Jongwoo Park, Jungpyo Hong, Miji Lee, Dongyoon Sun, Kyung Kang, Taesung Kim, Seungwon Kim, Sujin Kwon, Changkyu Joo, Sangsu Ha, Wooyeon Kim, Jongsu Ryu, Sangwoo Pae
Contact resistance of solder bump with low cost photosensitive polyimide for high performance SoC. IRPS (2015)