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CPI reliability and EMI benefit for MIM CAP embedded C4 package.

Hyunsuk ChunIn Hak BaickSangsu HaEunmi KwonSeungbae LeeSeil KimSangwoo PaeJongwoo Park
Published in: IRPS (2015)
Keyphrases
  • embedded systems
  • highly reliable
  • learning bayesian networks
  • real world
  • data mining
  • genetic algorithm
  • software package
  • real time
  • image processing
  • high level
  • multiscale
  • special case
  • control software