Minjung Jin

Publication Activity (10 Years)

Years Active: 2015-2023
Publications (10 Years): 4

Top Topics

Top Venues

Microelectron. Reliab.

Publications

Rakesh Ranjan, Pavitra Ramadevi Perepa, Ki-Don Lee, Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi, Jon Haefner, Caleb Dongkyun Kwon, Minjung Jin, Wenhao Zhou, Hyewon Shim, Shin-Young Chung
Impact of Barrier Metal Thickness on SRAM Reliability. IRPS (2023)
Minjung Jin, Kangjung Kim, Yoohwan Kim, Hyewon Shim, Jinju Kim, Gunrae Kim, Sangwoo Pae
gate stack. Microelectron. Reliab. 81 (2018)
Hyunjin Kim, Minjung Jin, Hyun-Chul Sagong, Jinju Kim, Ukjin Jung, Minhyuck Choi, Junekyun Park, Sangchul Shin, Sangwoo Pae
A systematic study of gate dielectric TDDB in FinFET technology. IRPS (2018)
Changze Liu, Hyun-Chul Sagong, Hyejin Kim, Seungjin Choo, Hyunwoo Lee, Yoohwan Kim, Hyunjin Kim, Bisung Jo, Minjung Jin, Jinjoo Kim, Sangsu Ha, Sangwoo Pae, Jongwoo Park
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. IRPS (2015)