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Experts
- María de la Luz Olvera-Amador
- Anna Zawadzka
- B. Sahraoui
- Domenico Caputo
- Arturo Maldonado
- Andrzej Korcala
- Bian Tian
- Benjamín Iñíguez
- K. Waszkowska
- Yasuhiro Matsumoto
- Hagen Klauk
- Zhuangde Jiang
- Magali Estrada
- Thomas Stieglitz
- Ilgu Yun
- C. A. Dimitriadis
- Augusto Nascetti
- Francisco Javier De Moure-Flores
- Panagiotis D. Christofides
- Ivona Z. Mitrovic
- Antonio Cerdeira
- Giampiero de Cesare
- Qijing Lin
- Arturo Morales-Acevedo
- Zhongkai Zhang
- Mutsumi Kimura
- Ute Zschieschang
- Na Zhao
- Marc Christopher Wurz
- Przemyslaw Plóciennik
- Shun'ichiro Ohmi
- George J. Papaioannou
- Won-Ju Cho
- Jose Santos-Cruz
- N. A. Hastas
- Giovanni Neri
- G. Kamarinos
- Filipe Vaz
- Yi Wang
Venues
- Sensors
- Microelectron. Reliab.
- Microelectron. J.
- NEMS
- IEICE Trans. Electron.
- CoRR
- IEEE SENSORS
- CCE
- Remote. Sens.
- IEEE Access
- ICTON
- IEEE Trans. Instrum. Meas.
- IGARSS
- IBM J. Res. Dev.
- ISPRS Int. J. Geo Inf.
- EMBC
- OFC
- SIAM J. Appl. Math.
- Symmetry
- DRC
- J. Comput. Chem.
- Proc. IEEE
- Adv. Intell. Syst.
- Int. J. Autom. Technol.
- Sci. China Inf. Sci.
- Comput. Geosci.
- SIAM J. Math. Anal.
- IEICE Electron. Express
- I2MTC
- J. Sensors
- ESSDERC
- Entropy
- Prod. Eng.
- IEEE Trans. Geosci. Remote. Sens.
- ICRA
- J. Inform. and Commun. Convergence Engineering
- ICICDT
- ACC
- IET Circuits Devices Syst.
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