Won-Ju Cho

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 11

Top Topics

Schottky Barrier

Electron Microscopy

Top Venues

Microelectron. Reliab.

Publications

Yeong-Ung Kim, Won-Ju Cho
Smart pH Sensing: A Self-Sensitivity Programmable Platform with Multi-Functional Charge-Trap-Flash ISFET Technology. Sensors 24 (3) (2024)
Tae-Hwan Hyun, Won-Ju Cho
Pushing the Limits of Biosensing: Selective Calcium Ion Detection with High Sensitivity via High-k Gate Dielectric Engineered Si Nanowire Random Network Channel Dual-Gate Field-Effect Transistors. Sensors 23 (15) (2023)
Hyeong-Un Jeon, Won-Ju Cho
Fully Transparent and Sensitivity-Programmable Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistor-Based Biosensor Platforms with Resistive Switching Memories. Sensors 21 (13) (2021)
Seong-Kun Cho, Won-Ju Cho
Highly Sensitive and Transparent Urea-EnFET Based Point-of-Care Diagnostic Test Sensor with a Triple-Gate a-IGZO TFT. Sensors 21 (14) (2021)
Seong-Kun Cho, Won-Ju Cho
Highly Sensitive and Selective Sodium Ion Sensor Based on Silicon Nanowire Dual Gate Field-Effect Transistor. Sensors 21 (12) (2021)
Hee Pyung Park, Sang Woo Kim, Joong-Won Shin, Won-Ju Cho, Jong Tae Park
Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors. Microelectron. Reliab. (2018)
Eun-Ki Hong, Won-Ju Cho
Effect of microwave annealing on SOI MOSFETs: Post-metal annealing with low thermal budget. Microelectron. Reliab. 80 (2018)
Sang Min Kim, Min-Soo Kang, Won-Ju Cho, Jong-Tae Park
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layer. Microelectron. Reliab. (2017)
Hyun Jong Kim, Byung Sang Song, Won-Ju Cho, Jong-Tae Park
Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. Microelectron. Reliab. (2017)
Jong Hoon Lee, Seul Ki Yu, Jae Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong-Tae Park
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64 (2016)
Sang Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong-Tae Park
Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64 (2016)
Seung Min Lee, Chong-Gun Yu, Seung Min Jeong, Won-Ju Cho, Jong-Tae Park
Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Seul Ki Lee, Sung Il Hong, Yeon Ho Lee, Se Won Lee, Won-Ju Cho, Jong-Tae Park
Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics. Microelectron. Reliab. 52 (9-10) (2012)
Jin-Young Kim, Jun-Seok Oh, Won-Ju Cho, Jong-Tae Park
NBTI and hot carrier effect of Schottky-barrier p-MOSFETs. Microelectron. Reliab. 50 (9-11) (2010)
Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu, Won-Ju Cho, M. Saif Islam, Jong-Tae Park
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. Microelectron. Reliab. 49 (9-11) (2009)
Dong-Uk Lee, Seon Pil Kim, Tae Hee Lee, Eun Kyu Kim, Hyun-Mo Koo, Won-Ju Cho, Young-Ho Kim
Nano-Particles Embedded in Polyimide Insulator. IEICE Trans. Electron. (5) (2008)
Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong-Tae Park
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. Microelectron. Reliab. 47 (9-11) (2007)