Jong Tae Park

Publication Activity (10 Years)

Years Active: 2004-2018
Publications (10 Years): 1

Top Topics

Finite Element Methods

Top Venues

Microelectron. Reliab.

Publications

Hee Pyung Park, Sang Woo Kim, Joong-Won Shin, Won-Ju Cho, Jong Tae Park
Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors. Microelectron. Reliab. (2018)
Dae Hyun Kim, Jong Tae Park
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination. Microelectron. Reliab. 55 (9-10) (2015)
Dae Hyun Kim, Jong Tae Park
The effect of gate overlap on the device degradation in IGZO thin film transistors. Microelectron. Reliab. 54 (9-10) (2014)
Hongbin Shi, F. X. Che, Cuihua Tian, Rui Zhang, Jong Tae Park, Toshitsugu Ueda
Analysis of edge and corner bonded PSvfBGA reliability under thermal cycling conditions by experimental and finite element methods. Microelectron. Reliab. 52 (9-10) (2012)
Rui Zhang, Hongbin Shi, Yuehong Dai, Jong Tae Park, Toshitsugu Ueda
Thermo-mechanical reliability optimization of MEMS-based quartz resonator using validated finite element model. Microelectron. Reliab. 52 (9-10) (2012)
Jong Tae Park, Shigeki Yamada, Marcus Brunner, Vincent Wade
Panel two: Ubiquitous computing and communications: challenges in the management of ubiquitous computing and communication. NOMS (1) (2004)