PLASMA ETCHING
Experts
- C. A. Dimitriadis
- Panagiotis D. Christofides
- María de la Luz Olvera-Amador
- K. Waszkowska
- B. Sahraoui
- Toly Chen
- Li Wen
- Yasuhiro Matsumoto
- Domenico Caputo
- G. Kamarinos
- Apostolos T. Voutsas
- Augusto Nascetti
- Ilgu Yun
- Hai Wang
- Anna Zawadzka
- Pedro Barquinha
- Giampiero de Cesare
- Ute Zschieschang
- Lei Sun
- Arturo Maldonado
- N. A. Hastas
- Cornelia K. Tsang
- Shun'ichiro Ohmi
- Laurent Vivien
- François Templier
- Leonid Mochalov
- Qiuping Zhang
- Jiaru Chu
- Bian Tian
- Yi Wang
- Hiroaki Usui
- Dedong Han
- Mutsumi Kimura
- In Man Kang
- Zhuangde Jiang
- Mauricio Ortega-López
- Hagen Klauk
- Paul S. Andry
- Mile Ivanda
Venues
- Sensors
- Microelectron. Reliab.
- Microelectron. J.
- NEMS
- IEICE Trans. Electron.
- ICTON
- OFC
- IEEE SENSORS
- CCE
- CoRR
- IEEE Access
- Proc. IEEE
- IBM J. Res. Dev.
- IEEE Trans. Instrum. Meas.
- Symmetry
- EMBC
- 3DIC
- IEICE Electron. Express
- SIAM J. Math. Anal.
- IEEE J. Solid State Circuits
- ECOC
- ISCAS
- DRC
- ESSDERC
- J. Comput. Phys.
- ICICDT
- Sci. China Inf. Sci.
- Int. J. Comput. Eng. Sci.
- J. Sensors
- Int. J. Autom. Technol.
- Displays
- ACC
- Comput. Phys. Commun.
- IET Circuits Devices Syst.
- ISSCC
- ITC
- SIAM J. Appl. Math.
- J. Inform. and Commun. Convergence Engineering
- CICC
Related Topics
Related Keywords
Popularity