C. A. Dimitriadis

Publication Activity (10 Years)

Years Active: 2003-2016
Publications (10 Years): 2

Top Topics

Global Information

Modeling Framework

Statistical Analysis

Top Venues

Microelectron. Reliab.

Publications

R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. ESSDERC (2016)
Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. Microelectron. Reliab. 56 (2016)
Dimitrios H. Tassis, Ioannis Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis
Variability of nanoscale triple gate FinFETs: Prediction and analysis method. ICECS (2014)
Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos G. Theodorou, Nicolas Planes, C. A. Dimitriadis, Gérard Ghibaudo
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. ESSDERC (2014)
Nikolaos Fasarakis, Andreas Tsormpatzoglou, Dimitrios H. Tassis, Konstantinos Papathanasiou, C. A. Dimitriadis, Gérard Ghibaudo
Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs. ICECS (2012)
N. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, François Templier, G. Kamarinos
Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors. Microelectron. Reliab. 51 (3) (2011)
N. Arpatzanis, A. T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos
Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. Microelectron. Reliab. 48 (4) (2008)
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. Microelectron. J. 37 (11) (2006)
Ilias Pappas, L. Nalpantidis, Vasilios Kalenteridis, Stilianos Siskos, Alkis A. Hatzopoulos, C. A. Dimitriadis
A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs. ISCAS (2006)
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. ISCAS (2006)
A. T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos
Effects of hot carriers in offset gated polysilicon thin-film transistors. Microelectron. Reliab. 46 (2-4) (2006)
Dimitrios H. Tassis, A. T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. Microelectron. Reliab. 46 (12) (2006)
N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, Adonios Thanailakis
Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. Microelectron. Reliab. 45 (2) (2005)
N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos
Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. Microelectron. Reliab. 43 (4) (2003)
N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva
Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. Microelectron. Reliab. 43 (1) (2003)