Variability of nanoscale triple gate FinFETs: Prediction and analysis method.
Dimitrios H. TassisIoannis MessarisNikolaos FasarakisAndreas TsormpatzoglouSpiros NikolaidisC. A. DimitriadisPublished in: ICECS (2014)
Keyphrases
- fully automatic
- cost function
- high precision
- experimental evaluation
- computational complexity
- segmentation method
- correlation analysis
- neural network
- optimization method
- probabilistic model
- computational cost
- significant improvement
- preprocessing
- support vector machine
- high accuracy
- statistical analysis
- clustering method
- detection method
- synthetic data
- dynamic programming
- artificial neural networks
- prediction model