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Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. TassisA. T. HatzopoulosN. ArpatzanisC. A. DimitriadisG. Kamarinos
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • thin film
  • high density
  • multi layer
  • short circuit
  • databases
  • neural network
  • data analysis
  • cost effective
  • electron microscopy
  • room temperature
  • liquid crystal displays