ELECTRON MICROSCOPY
Experts
- Andreas K. Maier
- Peter C. Doerschuk
- José María Carazo
- Amit Singer
- Francky Catthoor
- Tolga Tasdizen
- Carlos Oscar Sánchez Sorzano
- Henk Corporaal
- Roberto Marabini
- Gisela Anton
- Toby P. Breckon
- Naveen Verma
- Kaushik Roy
- Murali Jayapala
- Edoardo Charbon
- Jing Liu
- Zhaozheng Yin
- Neelanjan Bhowmik
- Ilker Hamzaoglu
- Jing He
- Masoud Babaie
- Min Xu
- Yona Falinie A. Gaus
- Pranav Rajpurkar
- Karl Rohr
- Mark H. Ellisman
- Gabriel Ciobanu
- Xiangrui Zeng
- Thomas Stieglitz
- Hoi-Jun Yoo
- Ronald M. Summers
- Pascal Fua
- Andrew Y. Ng
- Ge Wang
- Zhuangde Jiang
- Mei Chen
- Adrian Schwaninger
- Robert Bogdan Staszewski
- Franz Pfeiffer
Venues
- CoRR
- Sensors
- Microelectron. Reliab.
- ISBI
- NEMS
- EMBC
- IEEE Access
- Microelectron. J.
- IEICE Trans. Electron.
- Symmetry
- IEEE SENSORS
- J. Comput. Chem.
- IEEE Trans. Medical Imaging
- IEEE Trans. Instrum. Meas.
- ICIP
- ISCAS
- Comput. Phys. Commun.
- ICTON
- IBM J. Res. Dev.
- J. Chem. Inf. Model.
- Medical Imaging: Image Processing
- 3DIC
- CCE
- IEEE J. Solid State Circuits
- IEEE Trans. Biomed. Eng.
- ISSCC
- Remote. Sens.
- J. Imaging
- ICASSP
- Medical Image Anal.
- NeuroImage
- IGARSS
- IRPS
- IEICE Electron. Express
- Proc. IEEE
- ISLPED
- OFC
- BMC Bioinform.
- Bioinform.
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