ELECTRON MICROSCOPY
Experts
- Andreas K. Maier
- Peter C. Doerschuk
- José María Carazo
- Amit Singer
- Tolga Tasdizen
- Francky Catthoor
- Carlos Oscar Sánchez Sorzano
- Gisela Anton
- Roberto Marabini
- Henk Corporaal
- Toby P. Breckon
- Naveen Verma
- Kaushik Roy
- Jing Liu
- Edoardo Charbon
- Murali Jayapala
- Neelanjan Bhowmik
- Zhaozheng Yin
- Masoud Babaie
- Jing He
- Yona Falinie A. Gaus
- Ilker Hamzaoglu
- Min Xu
- Thomas Stieglitz
- Ronald M. Summers
- Hoi-Jun Yoo
- Karl Rohr
- Pascal Fua
- Pranav Rajpurkar
- Mark H. Ellisman
- Gabriel Ciobanu
- Xiangrui Zeng
- Andrew Y. Ng
- Ge Wang
- Adrian Schwaninger
- Robert Bogdan Staszewski
- C. A. Dimitriadis
- Takafumi Fukushima
- David L. Wilson
Venues
- CoRR
- Sensors
- Microelectron. Reliab.
- ISBI
- NEMS
- EMBC
- IEEE Access
- Microelectron. J.
- IEICE Trans. Electron.
- Symmetry
- IEEE SENSORS
- IEEE Trans. Medical Imaging
- J. Comput. Chem.
- IEEE Trans. Instrum. Meas.
- ISCAS
- ICIP
- Comput. Phys. Commun.
- ICTON
- Medical Imaging: Image Processing
- IBM J. Res. Dev.
- J. Chem. Inf. Model.
- 3DIC
- IEEE J. Solid State Circuits
- CCE
- IEEE Trans. Biomed. Eng.
- Remote. Sens.
- ISSCC
- IRPS
- OFC
- J. Imaging
- ICASSP
- Bioinform.
- IGARSS
- NeuroImage
- I2MTC
- Medical Image Anal.
- IEICE Electron. Express
- Int. J. Comput. Assist. Radiol. Surg.
- Proc. IEEE
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