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- Onur Mutlu
- Fumihito Arai
- Sung Kyu Lim
- Toshio Fukuda
- Sudeep Pasricha
- Luca Benini
- Hasan Hassan
- Giovanni De Micheli
- Xiaorui Wang
- Shinya Sakuma
- Keren Bergman
- Mahmut T. Kandemir
- Hamid Sarbazi-Azad
- Donghyuk Lee
- David T. Blaauw
- Jörg Henkel
- Yao-Wen Chang
- Makoto Nagata
- Yuan Xie
- Hideharu Amano
- Krishnendu Chakrabarty
- Kaushik Roy
- Takafumi Fukushima
- Gaudenzio Meneghesso
- Hannu Tenhunen
- Masahiro Nakajima
- Dennis Sylvester
- Xiaowei Li
- Saugata Ghose
- Shaolei Ren
- Wei Wang
- Mahdi Nikdast
- Minesh Patel
- Jeremie S. Kim
- Keijiro Suzuki
- Nam Sung Kim
- Mitsumasa Koyanagi
- Tadahiro Kuroda
- María de la Luz Olvera-Amador
Venues
- Sensors
- Microelectron. Reliab.
- CoRR
- OFC
- IEEE Access
- IEEE J. Solid State Circuits
- Microelectron. J.
- ISCAS
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- IEICE Trans. Electron.
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- DATE
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- IEEE Trans. Instrum. Meas.
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- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
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- IEEE Trans. Circuits Syst. I Regul. Pap.
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