IEEE Trans. Very Large Scale Integr. Syst.

Keyphrases

Publications

volume 32, number 6, 2024

Yerzhan Mustafa, Selçuk Köse
Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Bingbing Ma, Wei Li, Hongtao Xu
Analysis and Calibration of Bit Weights in SAR and Pipelined SAR ADCs Based on Code Distribution. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Jongchan An, Seung-Myeong Yu, Gwangmyeong An, Bongsu Kim, Hyunsu Jang, Sewook Hwang, Junyoung Song
A 0.7-pJ/b 12.5-Gb/s Reference-Less Subsampling Clock and Data Recovery Circuit. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Wei Xiong, Jiacheng Cao, Yaozhang Liu, Jian Wang, Jinmei Lai, Miaoqing Huang
A Reliable and Efficient Online Solution for Adaptive Voltage and Frequency Scaling on FPGAs. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Nastaran Darabi, Maeesha Binte Hashem, Hongyi Pan, Ahmet Enis Çetin, Wilfred Gomes, Amit Ranjan Trivedi
ADC/DAC-Free Analog Acceleration of Deep Neural Networks With Frequency Transformation. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Tianyang Yu, Bi Wu, Ke Chen, Chenggang Yan, Weiqiang Liu
Toward Efficient Retraining: A Large-Scale Approximate Neural Network Framework With Cross-Layer Optimization. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Hayoung Lee, Sooryeong Lee, Sungho Kang
RA-Aware Fail Data Collection Architecture for Cost Reduction. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Lingfeng Zhou, Shanlin Xiao, Huiyao Wang, Jinghai Wang, Zeyang Xu, Bohan Wang, Zhiyi Yu
Better-Than-Worst-Case: A Frequency Adaptation Asynchronous RISC-V Core With Vector Extension. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Xiao Wu, Miaoxin Wang, Jun Lin, Zhongfeng Wang
Amoeba: An Efficient and Flexible FPGA-Based Accelerator for Arbitrary-Kernel CNNs. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Alexandre Proulx, Jean-Yves Chouinard, Amine Miled, Paul Fortier
Analyzing the Vulnerabilities of External SDRAM on System-on-Chip Field Programmable Gate Array Devices. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Robert Balas, Alessandro Ottaviano, Luca Benini
CV32RT: Enabling Fast Interrupt and Context Switching for RISC-V Microcontrollers. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Amit Mazumder Shuvo, Tao Zhang, Farimah Farahmandi, Mark M. Tehranipoor
FLAT: Layout-Aware and Security Property-Assisted Timing Fault-Injection Attack Assessment. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)
Amisha Srivastava, Sanjay Das, Navnil Choudhury, Rafail Psiakis, Pedro Henrique Silva, Debjit Pal, Kanad Basu
SCAR: Power Side-Channel Analysis at RTL Level. IEEE Trans. Very Large Scale Integr. Syst. 32 (6) (2024)

volume 32, number 7, 2024

volume 32, number 8, 2024