Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration.
Shao-Chun HungArjun ChaudhuriSanmitra BanerjeeKrishnendu ChakrabartyPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2024)
Keyphrases
- fault diagnosis
- random access memory
- neural network
- expert systems
- fault detection
- monitoring and fault diagnosis
- electronic equipment
- fault detection and diagnosis
- chemical process
- fuzzy logic
- operating conditions
- multiple faults
- analog circuits
- gas turbine
- design considerations
- rotating machinery
- multi sensor information fusion
- condition monitoring
- bp neural network
- power transformers
- integrated circuit
- fault diagnostic
- input output
- data fusion
- data structure
- real time