MONITORING AND FAULT DIAGNOSIS
Experts
- Jong-Myon Kim
- Xuefeng Chen
- Zhongkui Zhu
- Ruqiang Yan
- Weihua Li
- Changqing Shen
- Haidong Shao
- Marios M. Polycarpou
- Fengshou Gu
- Krishnendu Chakrabarty
- Xingxing Jiang
- Chuan Li
- Haiyang Pan
- Khashayar Khorasani
- Andrew D. Ball
- Weiguo Huang
- Jinde Zheng
- René-Vinicio Sánchez
- Krishna R. Pattipati
- Bin Jiang
- Yong Lv
- Silvio Simani
- Minping Jia
- Mourad Elhadef
- Yigang He
- Zhibin Zhao
- Orestes Llanes-Santiago
- Sudhakar M. Reddy
- Hongkai Jiang
- Lei Shu
- Pabitra Mohan Khilar
- Irith Pomeranz
- Janusz Rajski
- Lina Yao
- Ruyi Huang
- Jianbo Yu
- Zhaobo Zhang
- Siliang Lu
- Xiaoan Yan
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Ind. Informatics
- CoRR
- Expert Syst. Appl.
- Entropy
- Eng. Appl. Artif. Intell.
- Neurocomputing
- Reliab. Eng. Syst. Saf.
- Knowl. Based Syst.
- ACC
- Adv. Eng. Informatics
- IECON
- J. Intell. Fuzzy Syst.
- Appl. Soft Comput.
- ECC
- CDC
- I2MTC
- CAA SAFEPROCESS
- Autom.
- ICPHM
- IEEE Trans. Computers
- ITC
- SAFEPROCESS
- SMC
- J. Intell. Manuf.
- Appl. Intell.
- Neural Comput. Appl.
- Comput. Chem. Eng.
- ICNC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Symmetry
- ICAC
- Asian Test Symposium
- IJCNN
- IEEE Trans. Control. Syst. Technol.
- CASE
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