MONITORING AND FAULT DIAGNOSIS
Experts
- Jong-Myon Kim
- Xuefeng Chen
- Zhongkui Zhu
- Ruqiang Yan
- Weihua Li
- Changqing Shen
- Haidong Shao
- Marios M. Polycarpou
- Fengshou Gu
- Krishnendu Chakrabarty
- Haiyang Pan
- Chuan Li
- Xingxing Jiang
- Khashayar Khorasani
- Andrew D. Ball
- Weiguo Huang
- René-Vinicio Sánchez
- Yong Lv
- Krishna R. Pattipati
- Silvio Simani
- Jinde Zheng
- Yigang He
- Orestes Llanes-Santiago
- Mourad Elhadef
- Zhibin Zhao
- Bin Jiang
- Minping Jia
- Lei Shu
- Janusz Rajski
- Hongkai Jiang
- Sudhakar M. Reddy
- Pabitra Mohan Khilar
- Irith Pomeranz
- Lina Yao
- Zhaobo Zhang
- Ruyi Huang
- Xinli Gu
- Siliang Lu
- Zhuyun Chen
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Ind. Informatics
- CoRR
- Expert Syst. Appl.
- Entropy
- Neurocomputing
- ACC
- Eng. Appl. Artif. Intell.
- Reliab. Eng. Syst. Saf.
- IECON
- Knowl. Based Syst.
- J. Intell. Fuzzy Syst.
- ECC
- CAA SAFEPROCESS
- Appl. Soft Comput.
- CDC
- ICPHM
- I2MTC
- Autom.
- ITC
- IEEE Trans. Computers
- Adv. Eng. Informatics
- SAFEPROCESS
- SMC
- Appl. Intell.
- Comput. Chem. Eng.
- ICNC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- J. Intell. Manuf.
- ICAC
- Neural Comput. Appl.
- IJCNN
- Asian Test Symposium
- IEEE Trans. Control. Syst. Technol.
- CASE
- INDIN
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