Michael G. Pecht

ORCID

Publication Activity (10 Years)

Years Active: 1987-2024
Publications (10 Years): 145

Top Venues

IEEE Access

IEEE Trans. Ind. Electron.

Microelectron. Reliab.

ICPHM

Publications

Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
Flip-chip solder bumps defect detection using a self-search lightweight framework. Adv. Eng. Informatics 60 (2024)
Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht
Corrections to "Water-Resistant Smartphone Technologies". IEEE Access 12 (2024)
Siyu Zhang, Lei Su, Jiefei Gu, Ke Li, Weitian Wu, Michael G. Pecht
Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection. Expert Syst. Appl. 238 (Part B) (2024)
Varun Khemani, Michael H. Azarian, Michael G. Pecht
WavePHMNet: A comprehensive diagnosis and prognosis approach for analog circuits. Adv. Eng. Informatics 59 (2024)
Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection. IEEE Trans. Ind. Informatics 20 (8) (2024)
Chuanjiang Li, Shaobo Li, Yixiong Feng, Konstantinos Gryllias, Fengshou Gu, Michael G. Pecht
Small data challenges for intelligent prognostics and health management: a review. Artif. Intell. Rev. 57 (8) (2024)
Hao Lyu, Hongchen Qu, Zaiyou Yang, Li Ma, Bing Lu, Michael G. Pecht
Reliability analysis of dependent competing failure processes with time-varying δ shock model. Reliab. Eng. Syst. Saf. 229 (2023)
Syed Mujahid Abbas, Qiang Yu, Michael G. Pecht
Influence of Substrate on Microvia Structures in Printed Circuit Boards During Reflow. IEEE Access 11 (2023)
Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE Trans. Instrum. Meas. 72 (2023)
Mohamed Arezki Mellal, Enrico Zio, Michael G. Pecht
Multi-objective reliability and cost optimization of fuel cell vehicle system with fuzzy feasibility. Inf. Sci. 640 (2023)
Hao Lyu, Hongchen Qu, Hualong Xie, Yimin Zhang, Michael G. Pecht
Reliability analysis of the multi-state system with nonlinear degradation model under Markov environment. Reliab. Eng. Syst. Saf. 238 (2023)
Yinghong Zhao, Xiao He, Donghua Zhou, Michael G. Pecht
Detection and Isolation of Wheelset Intermittent Over-Creeps for Electric Multiple Units Based on a Weighted Moving Average Technique. IEEE Trans. Intell. Transp. Syst. 23 (4) (2022)
Chuanjiang Li, Shaobo Li, Ansi Zhang, Lei Yang, Enrico Zio, Michael G. Pecht, Konstantinos Gryllias
A Siamese hybrid neural network framework for few-shot fault diagnosis of fixed-wing unmanned aerial vehicles. J. Comput. Des. Eng. 9 (4) (2022)
Xiaosong Hu, Xinchen Deng, Feng Wang, Zhongwei Deng, Xianke Lin, Remus Teodorescu, Michael G. Pecht
A Review of Second-Life Lithium-Ion Batteries for Stationary Energy Storage Applications. Proc. IEEE 110 (6) (2022)
Hao Lyu, Shuai Wang, Li Ma, Xiaowen Zhang, Michael G. Pecht
Reliability modeling for planetary gear transmission system considering dependent failure processes. Qual. Reliab. Eng. Int. 38 (1) (2022)
Zhenyu Wu, Hongkui Zhang, Juchuan Guo, Yang Ji, Michael G. Pecht
Imbalanced bearing fault diagnosis under variant working conditions using cost-sensitive deep domain adaptation network. Expert Syst. Appl. 193 (2022)
Shehla Amir, Moneeba Gulzar, Muhammad Osama Tarar, Ijaz Haider Naqvi, Nauman A. Zaffar, Michael G. Pecht
Dynamic Equivalent Circuit Model to Estimate State-of-Health of Lithium-Ion Batteries. IEEE Access 10 (2022)
Harsha Walvekar, Hector Beltran, Shashank Sripad, Michael G. Pecht
Implications of the Electric Vehicle Manufacturers' Decision to Mass Adopt Lithium-Iron Phosphate Batteries. IEEE Access 10 (2022)
Dylan A. Hazelwood, Michael G. Pecht
Life Extension of Electronic Products: A Case Study of Smartphones. IEEE Access 9 (2021)
Changyong Lee, Sugyeong Jo, Daeil Kwon, Michael G. Pecht
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries. IEEE Trans. Ind. Electron. 68 (3) (2021)
Bin Zhang, Tao Liu, Bin Zhang, Michael G. Pecht
Recent Development of Unpowered Exoskeletons for Lower Extremity: A Survey. IEEE Access 9 (2021)
Zhen Jia, Zhenbao Liu, Yanfen Gan, Chi-Man Vong, Michael G. Pecht
A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems. IEEE Trans. Ind. Electron. 68 (10) (2021)
Ryan Aalund, Weiping Diao, Lingxi Kong, Michael G. Pecht
Understanding the Non-Collision Related Battery Safety Risks in Electric Vehicles a Case Study in Electric Vehicle Recalls and the LG Chem Battery. IEEE Access 9 (2021)
Darius Roman, Saurabh Saxena, Jens Bruns, Valentin Robu, Michael G. Pecht, David Flynn
A Machine Learning Degradation Model for Electrochemical Capacitors Operated at High Temperature. IEEE Access 9 (2021)
Chun Cheng, Yan Hu, Jinrui Wang, Haining Liu, Michael G. Pecht
Generalized sparse filtering for rotating machinery fault diagnosis. J. Supercomput. 77 (4) (2021)
Yu Zang, Wei ShangGuan, Baigen Cai, Huashen Wang, Michael G. Pecht
Hybrid remaining useful life prediction method. A case study on railway D-cables. Reliab. Eng. Syst. Saf. 213 (2021)
Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics. IEEE Access 9 (2021)
Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Shaojiang Dong, Michael G. Pecht
Deep Residual Networks With Adaptively Parametric Rectifier Linear Units for Fault Diagnosis. IEEE Trans. Ind. Electron. 68 (3) (2021)
Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht
Detection of intermittent faults based on an optimally weighted moving average T2 control chart with stationary observations. Autom. 123 (2021)
Bin Xu, Lingxi Kong, Guangrui Wen, Michael G. Pecht
Protection Devices in Commercial 18650 Lithium-Ion Batteries. IEEE Access 9 (2021)
Hao Lyu, Zaiyou Yang, Shuai Wang, Yaping Zhao, Michael G. Pecht
Reliability modeling for multistage systems subject to competing failure processes. Qual. Reliab. Eng. Int. 37 (6) (2021)
Hao Lyu, Xiaowen Zhang, Zaiyou Yang, Shuai Wang, Changyou Li, Michael G. Pecht
Reliability Analysis for the Dependent Competing Failure With Wear Model and its Application to the Turbine and Worm System. IEEE Access 9 (2021)
Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors. IEEE Access 9 (2021)
Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn
Machine learning pipeline for battery state-of-health estimation. Nat. Mach. Intell. 3 (5) (2021)
Lei Su, Xiaonan Yu, Ke Li, Jiefei Gu, Michael G. Pecht
Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation. IEEE Trans. Ind. Electron. 68 (10) (2021)
Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn
Machine learning pipeline for battery state of health estimation. CoRR (2021)
Kai Wang, Haifeng Guo, Aidong Xu, Michael G. Pecht
Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View. Sensors 20 (13) (2020)
Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access 8 (2020)
Hayder Ali, Hassan Abbas Khan, Michael G. Pecht
Evaluation of Li-Based Battery Current, Voltage, and Temperature Profiles for In-Service Mobile Phones. IEEE Access 8 (2020)
Seong-Woo Woo, Michael G. Pecht, Dennis L. O'Neal
Reliability design and case study of the domestic compressor subjected to repetitive internal stresses. Reliab. Eng. Syst. Saf. 193 (2020)
Lu Zhang, Hongjuan Ge, Ying Ma, Jianliang Xue, Huang Li, Michael G. Pecht
Multi-Objective Optimization Design of a Notch Filter Based on Improved NSGA-II for Conducted Emissions. IEEE Access 8 (2020)
Zhenyu Wu, Wenfang Lin, Binghao Fu, Juchuan Guo, Yang Ji, Michael G. Pecht
A Local Adaptive Minority Selection and Oversampling Method for Class-Imbalanced Fault Diagnostics in Industrial Systems. IEEE Trans. Reliab. 69 (4) (2020)
Namkyoung Lee, Michael H. Azarian, Michael G. Pecht
An Explainable Deep Learning-based Prognostic Model for Rotating Machinery. CoRR (2020)
Hamidreza Habibollahi Najaf Abadi, Michael G. Pecht
Artificial Intelligence Trends Based on the Patents Granted by the United States Patent and Trademark Office. IEEE Access 8 (2020)
Wenliao Du, Myeongsu Kang, Michael G. Pecht
Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis. IEEE Trans. Ind. Electron. 67 (3) (2020)
Weiping Diao, Saurabh Saxena, Michael G. Pecht
Analysis of Specified Capacity in Power Banks. IEEE Access 8 (2020)
Xingyan Yao, Lingxi Kong, Michael G. Pecht
Reliability of Cylindrical Li-ion Battery Safety Vents. IEEE Access 8 (2020)
Hamidreza Habibollahi Najaf Abadi, Zhou He, Michael G. Pecht
Artificial Intelligence-Related Research Funding by the U.S. National Science Foundation and the National Natural Science Foundation of China. IEEE Access 8 (2020)
Wei ShangGuan, Yu Zang, Huashen Wang, Michael G. Pecht
Board-Level Lifetime Prediction for Power Board of Balise Transmission Module in High-Speed Railways. IEEE Access 8 (2020)
Chien-Ming Huang, Anto Raj, Michael D. Osterman, Michael G. Pecht
Assembly Options and Challenges for Electronic Products With Lead-Free Exemption. IEEE Access 8 (2020)
Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht
Correction to "Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis". IEEE Access 8 (2020)
Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Michael G. Pecht
Deep Residual Shrinkage Networks for Fault Diagnosis. IEEE Trans. Ind. Informatics 16 (7) (2020)
Arjun Kumar, Mohammad Ashraful Hoque, Petteri Nurmi, Michael G. Pecht, Sasu Tarkoma, Junehwa Song
Battery Health Estimation for IoT Devices using V-Edge Dynamics. HotMobile (2020)
Yinghong Zhao, Xiao He, Michael G. Pecht, Junfeng Zhang, Donghua Zhou
Detection and Detectability of Intermittent Faults Based on Moving Average T2 Control Charts with Multiple Window Lengths. CoRR (2020)
Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht
Detection of Intermittent Faults Based on an Optimally Weighted Moving Average T^2 Control Chart with Stationary Gaussian Observations. CoRR (2020)
Rui Xiong, Yongzhi Zhang, Ju Wang, Hongwen He, Simin Peng, Michael G. Pecht
Lithium-Ion Battery Health Prognosis Based on a Real Battery Management System Used in Electric Vehicles. IEEE Trans. Veh. Technol. 68 (5) (2019)
Jingying Zhao, Yongqi Xing, Zhengliang Sun, Michael G. Pecht
Transmission characteristics analysis of an MCR-WPT system with SP resonance structure based on harmonic current influence. IEICE Electron. Express 16 (17) (2019)
Xingyan Yao, Saurabh Saxena, Lei Su, Michael G. Pecht
The Explosive Nature of Tab Burrs in Li-Ion Batteries. IEEE Access 7 (2019)
Haining Liu, Yixiang Wang, Fajia Li, Xiaohong Wang, Chengliang Liu, Michael G. Pecht
Perceptual Vibration Hashing by Sub-Band Coding: An Edge Computing Method for Condition Monitoring. IEEE Access 7 (2019)
Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht
Multiple Wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis. IEEE Trans. Ind. Electron. 66 (6) (2019)
Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood
Evaluating Impact of Information Uncertainties on Component Reliability Assessment. IRPS (2019)
Xingyan Yao, Michael G. Pecht
Tab Design and Failures in Cylindrical Li-ion Batteries. IEEE Access 7 (2019)
Yan Su, Xue Rui Liang, Chenxuan Gu, Varun Khemani, Michael G. Pecht
A Multivalued Test and Diagnostic Strategy Optimization Method for Aircraft System Fault Diagnosis. ICPHM (2019)
Yongquan Sun, Lingxi Kong, Hassan Abbas Khan, Michael G. Pecht
. IEEE Access 7 (2019)
Saikath Bhattacharya, Lance Fiondella, Saurabh Saxena, Michael G. Pecht
Quantifying the Impact of Prognostic Distance on Average Cost per Cycle. ICPHM (2019)
Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht
Breaking the Trust: How Companies Are Failing Their Customers. IEEE Access 7 (2019)
Namkyoung Lee, Michael H. Azarian, Michael G. Pecht, Jinyong Kim, Jongsoon Im
A Comparative Study of Deep Learning-Based Diagnostics for Automotive Safety Components Using a Raspberry Pi. ICPHM (2019)
Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht
Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis. IEEE Access 7 (2019)
Fateme Dinmohammadi, David Flynn, Chris Bailey, Michael G. Pecht, Chunyan Yin, Pushparajah Rajaguru, Valentin Robu
Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications. IEEE Access 7 (2019)
Zhenyu Wu, Shuyang Yu, Xinning Zhu, Yang Ji, Michael G. Pecht
A Weighted Deep Domain Adaptation Method for Industrial Fault Prognostics According to Prior Distribution of Complex Working Conditions. IEEE Access 7 (2019)
Zhen Jia, Zhenbao Liu, Chi-Man Vong, Michael G. Pecht
A Rotating Machinery Fault Diagnosis Method Based on Feature Learning of Thermal Images. IEEE Access 7 (2019)
Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht
Lithium-Ion Battery Remaining Useful Life Prediction With Box-Cox Transformation and Monte Carlo Simulation. IEEE Trans. Ind. Electron. 66 (2) (2019)
Pandav Kiran Maroti, Sanjeevikumar Padmanaban, Jens Bo Holm-Nielsen, Michael G. Pecht, Olouremfemi Ojo
A Novel Configurations of Modified CUK Converter Using Multiple VLSI Modules for High Voltage Renewable Energy Application. IECON (2019)
Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael G. Pecht
Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound. IEEE Access 7 (2019)
Yan Su, Xue Rui Liang, Hui Wang, Jin Jun Wang, Michael G. Pecht
A Maintenance and Troubleshooting Method Based on Integrated Information and System Principles. IEEE Access 7 (2019)
Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints. IEEE Access 7 (2019)
Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht
Water-Resistant Smartphone Technologies. IEEE Access 7 (2019)
Jinwoo Lee, Daeil Kwon, Michael G. Pecht
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management. IEEE Trans. Ind. Electron. 66 (9) (2019)
Ryan Aalund, Michael G. Pecht
The Use of UL 1642 Impact Testing for Li-ion Pouch Cells. IEEE Access 7 (2019)
Varun Khemani, Michael H. Azarian, Michael G. Pecht
Electronic Circuit Diagnosis with No Data. ICPHM (2019)
Yapeng Zhou, Miaohua Huang, Michael G. Pecht
An Online State of Health Estimation Method for Lithium-ion Batteries Based on Integrated Voltage. ICPHM (2018)
Saurabh Saxena, Myeongsu Kang, Yinjiao Xing, Michael G. Pecht
Anomaly Detection During Lithium-ion Battery Qualification Testing. ICPHM (2018)
Jingying Zhao, Zhengliang Sun, Michael G. Pecht, Sinuo Zhou
Analysis and experiments on transmission characteristics of LCCL mobile wireless power transfer system. IEICE Electron. Express 15 (23) (2018)
Zhenbao Liu, Zhen Jia, Chi-Man Vong, Junwei Han, Chenggang Yan, Michael G. Pecht
A Patent Analysis of Prognostics and Health Management (PHM) Innovations for Electrical Systems. IEEE Access 6 (2018)
Rui Xiong, Yongzhi Zhang, Hongwen He, Xuan Zhou, Michael G. Pecht
A Double-Scale, Particle-Filtering, Energy State Prediction Algorithm for Lithium-Ion Batteries. IEEE Trans. Ind. Electron. 65 (2) (2018)
Wenliao Du, Sugai Han, Xiaowei Song, Shuxia Tian, Michael G. Pecht
Condition Monitoring Model of a Hydraulic System in Truck Crane. ICPHM (2018)
Mehdi Kohani, Michael G. Pecht
Malfunctions of Medical Devices Due to Electrostatic Occurrences Big Data Analysis of 10 Years of the FDA's Reports. IEEE Access 6 (2018)
Kai Wang, Haifeng Guo, Aidong Xu, N. Jordan Jameson, Michael G. Pecht, Bingjun Yan
Creating Self-Aware Low-Voltage Electromagnetic Coils for Incipient Insulation Degradation Monitoring for Smart Manufacturing. IEEE Access 6 (2018)
Michael G. Pecht
An Editorial From the Editor-in-Chief of the IEEE ACCESS, at the End of his Six Year Term. IEEE Access 6 (2018)
Fardin Dalvand, Myeongsu Kang, Satar Dalvand, Michael G. Pecht
Detection of Generalized-Roughness and Single-Point Bearing Faults Using Linear Prediction-Based Current Noise Cancellation. IEEE Trans. Ind. Electron. 65 (12) (2018)
Yongquan Sun, Tieyuan Sun, Michael G. Pecht, Chunyu Yu
Computing Lifetime Distributions and Reliability for Systems With Outsourced Components: A Case Study. IEEE Access 6 (2018)
Saurabh Saxena, Lingxi Kong, Michael G. Pecht
Exploding E-Cigarettes: A Battery Safety Issue. IEEE Access 6 (2018)
Yongquan Sun, Xueling Hao, Michael G. Pecht, Yapeng Zhou
Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator. Microelectron. Reliab. (2018)
Jie Gao, Myeongsu Kang, Jing Tian, Lifeng Wu, Michael G. Pecht
Unsupervised Locality-Preserving Robust Latent Low-Rank Recovery-Based Subspace Clustering for Fault Diagnosis. IEEE Access 6 (2018)
Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht
Long Short-Term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-Ion Batteries. IEEE Trans. Veh. Technol. 67 (7) (2018)
Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht
Deep Residual Networks With Dynamically Weighted Wavelet Coefficients for Fault Diagnosis of Planetary Gearboxes. IEEE Trans. Ind. Electron. 65 (5) (2018)
Xuejiao Du, Zhaojun Yang, Chuanhai Chen, Xiaoxu Li, Michael G. Pecht
Reliability Analysis of Repairable Systems Based on a Two-Segment Bathtub-Shaped Failure Intensity Function. IEEE Access 6 (2018)
Subramani Manoharan, Chandradip Patel, F. Patrick McCluskey, Michael G. Pecht
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment. Microelectron. Reliab. 84 (2018)
Payam Motabar, Helmuth E. Gonzalez, Peter Rundle, Michael G. Pecht
How Poor Reliability Affects Warranties: An Analysis of General Motors' Powertrain Warranty Reduction. IEEE Access 6 (2018)
Chien-Ming Huang, Daniel Nunez, James Coburn, Michael G. Pecht
Risk of tin whiskers in the nuclear industry. Microelectron. Reliab. 81 (2018)

Michael G. Pecht.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Michael G. Pecht