A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection.
Yu SunLei SuJiefei GuKe LiMichael G. PechtPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- defect detection
- chip design
- probability theory
- input output
- feature extraction
- micron cmos
- quantum computation
- modal logic
- high speed
- classical logic
- random access memory
- automated visual inspection
- probability distribution
- low cost
- physical design
- programmable logic
- predicate logic
- textured surfaces
- single chip
- multi valued
- high density
- conditional probabilities
- logical framework
- neural network