AUTOMATED VISUAL INSPECTION
Experts
- Wenming Lin
- Du-Ming Tsai
- Marcos Portabella
- Yukino Baba
- Hisashi Kashima
- Rubén Usamentiaga
- Daniel F. GarcÃa
- Ad Stoffelen
- Chuan-Yu Chang
- Stefan Biffl
- Rahul Pandita
- Rosa RodrÃguez-Montañés
- Paulo Leitão
- Dunja Mladenic
- Joze M. Rozanec
- Haiyong Chen
- Xuewu Zhang
- Chih-Yang Lin
- Ben Glocker
- Blaz Fortuna
- Joan Figueras
- Stefan Wagner
- Hong-Dar Lin
- Tielin Shi
- Xiangning Lu
- Krishnendu Chakrabarty
- Yuxiang Yang
- Fityanul Akhyar
- Ricardo Buettner
- Bostjan Likar
- Yiyong Yao
- Georgina Cosma
- Max A. Little
- Jiajun Zhang
- Patricia Melin
- Ajay Kumar
- Hermann Baumgartl
- Guanglan Liao
- Yang Zhang
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Remote. Sens.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Mach. Vis. Appl.
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- MVA
- Comput. Electron. Agric.
- Eng. Appl. Artif. Intell.
- Microelectron. Reliab.
- IROS
- Image Vis. Comput.
- BMVC
- Comput. Ind.
- BMC Bioinform.
- Adv. Eng. Informatics
- ICIP
- Multim. Tools Appl.
- IEEE Trans. Ind. Electron.
- I2MTC
- CASE
- J. Digit. Imaging
- Comput. Ind. Eng.
- ETFA
- Pattern Recognit.
- Eur. J. Oper. Res.
- Real Time Imaging
- ICRA
- SMC
- Qual. Reliab. Eng. Int.
- M2VIP
- Technometrics
- Digital Mammography / IWDM
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