AUTOMATED VISUAL INSPECTION
Experts
- Wenming Lin
- Du-Ming Tsai
- Yukino Baba
- Marcos Portabella
- Rubén Usamentiaga
- Ad Stoffelen
- Hisashi Kashima
- Daniel F. García
- Stefan Biffl
- Chuan-Yu Chang
- Blaz Fortuna
- Haiyong Chen
- Stefan Wagner
- Dunja Mladenic
- Ben Glocker
- Rahul Pandita
- Paulo Leitão
- Xuewu Zhang
- Rosa Rodríguez-Montañés
- Chih-Yang Lin
- Hong-Dar Lin
- Joze M. Rozanec
- Joan Figueras
- Francisco G. Bulnes
- Julio Molleda
- Hermann Baumgartl
- Yuxiang Yang
- Dejan Tomazevic
- Georgina Cosma
- Yordan P. Raykov
- Alberto Tellaeche
- Biao Jiang
- Max A. Little
- Wenjia Bai
- Ricardo Buettner
- Stefan K. Piechnik
- Tielin Shi
- Fityanul Akhyar
- Patricia Melin
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Mach. Vis. Appl.
- Remote. Sens.
- ITC
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- J. Electronic Imaging
- MVA
- IROS
- Microelectron. Reliab.
- J. Intell. Manuf.
- Comput. Ind.
- BMC Bioinform.
- Image Vis. Comput.
- BMVC
- Comput. Electron. Agric.
- ICIP
- Eng. Appl. Artif. Intell.
- Multim. Tools Appl.
- CASE
- Comput. Ind. Eng.
- Adv. Eng. Informatics
- IEEE Trans. Ind. Electron.
- ETFA
- J. Digit. Imaging
- Pattern Recognit.
- I2MTC
- ICRA
- Real Time Imaging
- Eur. J. Oper. Res.
- M2VIP
- Digital Mammography / IWDM
- SMC
- NeuroImage
- Technometrics
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