AUTOMATED VISUAL INSPECTION
Experts
- Du-Ming Tsai
- Wenming Lin
- Yukino Baba
- Marcos Portabella
- Rubén Usamentiaga
- Daniel F. García
- Chuan-Yu Chang
- Hisashi Kashima
- Stefan Biffl
- Ad Stoffelen
- Ben Glocker
- Haiyong Chen
- Rosa Rodríguez-Montañés
- Joan Figueras
- Paulo Leitão
- Dunja Mladenic
- Stefan Wagner
- Blaz Fortuna
- Xuewu Zhang
- Hong-Dar Lin
- Rahul Pandita
- Chih-Yang Lin
- Joze M. Rozanec
- Guanglan Liao
- Xiangning Lu
- Hao Zhang
- Yordan P. Raykov
- Jun Wang
- Krishnendu Chakrabarty
- Thomas O. Binford
- Patricia Melin
- Max A. Little
- Bostjan Likar
- Oscar Castillo
- Nicola Paone
- Yang Zhang
- Marco Rudolph
- Jorge L. C. Sanz
- Bastian Wandt
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Expert Syst. Appl.
- Remote. Sens.
- Mach. Vis. Appl.
- IEEE Trans. Ind. Informatics
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- MVA
- Comput. Electron. Agric.
- Eng. Appl. Artif. Intell.
- IROS
- Microelectron. Reliab.
- BMC Bioinform.
- Comput. Ind.
- BMVC
- Image Vis. Comput.
- Adv. Eng. Informatics
- Multim. Tools Appl.
- ICIP
- IEEE Trans. Ind. Electron.
- CASE
- I2MTC
- J. Digit. Imaging
- Comput. Ind. Eng.
- ETFA
- ICRA
- Eur. J. Oper. Res.
- Real Time Imaging
- Pattern Recognit.
- Qual. Reliab. Eng. Int.
- Digital Mammography / IWDM
- Technometrics
- M2VIP
- NeuroImage
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