AUTOMATED VISUAL INSPECTION
Experts
- Du-Ming Tsai
- Wenming Lin
- Yukino Baba
- Marcos Portabella
- Stefan Biffl
- Chuan-Yu Chang
- Hisashi Kashima
- Daniel F. GarcÃa
- Ad Stoffelen
- Rubén Usamentiaga
- Blaz Fortuna
- Ben Glocker
- Chih-Yang Lin
- Stefan Wagner
- Hong-Dar Lin
- Joan Figueras
- Joze M. Rozanec
- Dunja Mladenic
- Rosa RodrÃguez-Montañés
- Paulo Leitão
- Rahul Pandita
- Xuewu Zhang
- Haiyong Chen
- Biao Jiang
- Wenjia Bai
- Liping Zhao
- Alberto Tellaeche
- Hao Zhang
- Daniel Rueckert
- Jukka Iivarinen
- Marco Rudolph
- Oscar Castillo
- Sarah L. Bugby
- Mingyu Gao
- Jorge L. C. Sanz
- Bastian Wandt
- Jun Wang
- Bodo Rosenhahn
- Thomas O. Binford
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Remote. Sens.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Mach. Vis. Appl.
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- MVA
- Comput. Electron. Agric.
- Eng. Appl. Artif. Intell.
- IROS
- Microelectron. Reliab.
- Image Vis. Comput.
- Comput. Ind.
- BMVC
- BMC Bioinform.
- Adv. Eng. Informatics
- Multim. Tools Appl.
- ICIP
- IEEE Trans. Ind. Electron.
- I2MTC
- CASE
- J. Digit. Imaging
- Comput. Ind. Eng.
- ETFA
- Pattern Recognit.
- Eur. J. Oper. Res.
- Real Time Imaging
- ICRA
- Qual. Reliab. Eng. Int.
- SMC
- M2VIP
- Digital Mammography / IWDM
- Technometrics
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