AUTOMATED VISUAL INSPECTION
Experts
- Wenming Lin
- Du-Ming Tsai
- Yukino Baba
- Marcos Portabella
- Chuan-Yu Chang
- Daniel F. GarcÃa
- Rubén Usamentiaga
- Stefan Biffl
- Hisashi Kashima
- Ad Stoffelen
- Joan Figueras
- Hong-Dar Lin
- Chih-Yang Lin
- Rahul Pandita
- Haiyong Chen
- Xuewu Zhang
- Dunja Mladenic
- Rosa RodrÃguez-Montañés
- Paulo Leitão
- Blaz Fortuna
- Joze M. Rozanec
- Ben Glocker
- Stefan Wagner
- Bostjan Likar
- Dejan Tomazevic
- Jun Wang
- Bastian Wandt
- MuDer Jeng
- Max A. Little
- Yordan P. Raykov
- Fityanul Akhyar
- Jiajun Zhang
- Sarah L. Bugby
- Alberto Tellaeche
- Biao Jiang
- Julio Molleda
- Krishnendu Chakrabarty
- Daniel Rueckert
- Mingyu Gao
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Expert Syst. Appl.
- Remote. Sens.
- Mach. Vis. Appl.
- IEEE Trans. Ind. Informatics
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- MVA
- Comput. Electron. Agric.
- Eng. Appl. Artif. Intell.
- Microelectron. Reliab.
- IROS
- Comput. Ind.
- BMC Bioinform.
- BMVC
- Image Vis. Comput.
- Adv. Eng. Informatics
- ICIP
- Multim. Tools Appl.
- IEEE Trans. Ind. Electron.
- I2MTC
- CASE
- ETFA
- Comput. Ind. Eng.
- J. Digit. Imaging
- Pattern Recognit.
- Eur. J. Oper. Res.
- Real Time Imaging
- ICRA
- NeuroImage
- SMC
- M2VIP
- Technometrics
- Qual. Reliab. Eng. Int.
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