Du-Ming Tsai

Publication Activity (10 Years)

Years Active: 1992-2024
Publications (10 Years): 10

Top Topics

Defect Detection

Semiconductor Manufacturing

Convolutional Neural Networks

Action Recognition

Top Venues

IEEE Trans Autom. Sci. Eng.

IEEE Trans. Instrum. Meas.

Adv. Eng. Informatics

Comput. Electron. Agric.

Publications

Carlos Solorzano, Du-Ming Tsai
Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks. IEEE Trans Autom. Sci. Eng. 21 (3) (2024)
Shu-Kai S. Fan, Chun-Wei Cheng, Du-Ming Tsai
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. IEEE Trans Autom. Sci. Eng. 19 (4) (2022)
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Mabel C. Chou, Chih-Hung Jen, Jen-Hsuan Tsou
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 19 (3) (2022)
Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou
Auto-Annotated Deep Segmentation for Surface Defect Detection. IEEE Trans. Instrum. Meas. 70 (2021)
Du-Ming Tsai, Po-Hao Jen
Autoencoder-based anomaly detection for surface defect inspection. Adv. Eng. Informatics 48 (2021)
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 17 (4) (2020)
Du-Ming Tsai, Yi-Hsiang Chou
Fast and Precise Positioning in PCBs Using Deep Neural Network Regression. IEEE Trans. Instrum. Meas. 69 (7) (2020)
Du-Ming Tsai, Morris S. K. Fan, Yi-Quan Huang, Wei-Yao Chiu
Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification. VISIGRAPP (5: VISAPP) (2019)
Du-Ming Tsai, Yi-Chun Hsieh
Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique. IEEE Trans. Instrum. Meas. 66 (11) (2017)
Du-Ming Tsai, Wan-Ling Chen
Coffee plantation area recognition in satellite images using Fourier transform. Comput. Electron. Agric. 135 (2017)
Du-Ming Tsai, Yan-Hsin Tseng, Wei-Yao Chiu
Surface defect detection in low-contrast images using basis image representation. MVA (2015)
Du-Ming Tsai, Wei-Yao Chiu, Tzu-Hsun Tseng
Moving object detection from a mobile robot using basis image matching. Intelligent Robots and Computer Vision: Algorithms and Techniques (2015)
Du-Ming Tsai, Guan-Nan Li, Wei-Chen Li, Wei-Yao Chiu
Defect detection in multi-crystal solar cells using clustering with uniformity measures. Adv. Eng. Informatics 29 (3) (2015)
Du-Ming Tsai, Wei-Yao Chiu, Men-Han Lee
Optical flow-motion history image (OF-MHI) for action recognition. Signal Image Video Process. 9 (8) (2015)
Wei-Yao Chiu, Du-Ming Tsai
Dual-mode detection for foreground segmentation in low-contrast video images. J. Real Time Image Process. 9 (4) (2014)
Du-Ming Tsai, Hao Hsu, Wei-Yao Chiu
3-D vision-assist guidance for robots or the visually impaired. Ind. Robot 41 (4) (2014)
Du-Ming Tsai, Tzu-Hsun Tseng
A template reconstruction scheme for moving object detection from a mobile robot. Ind. Robot 40 (6) (2013)
Du-Ming Tsai, Wei-Yao Chiu
A real-time ICA-based activity recognition in video sequences. MVA (2013)
Du-Ming Tsai, Shih-Chieh Wu, Wei-Yao Chiu
Defect Detection in Solar Modules Using ICA Basis Images. IEEE Trans. Ind. Informatics 9 (1) (2013)
Du-Ming Tsai, Wei-Yao Chiu
Dual-mode Detection for Foreground Segmentation in Low-contrast Video Images. VISAPP (1) (2013)
Wei-Chen Li, Du-Ming Tsai
Wavelet-based defect detection in solar wafer images with inhomogeneous texture. Pattern Recognit. 45 (2) (2012)
Du-Ming Tsai, I-Yung Chiang, Ya-Hui Tsai
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection. IEEE Trans. Ind. Informatics 8 (1) (2012)
Du-Ming Tsai, Ming-Chun Chen, Wei-Chen Li, Wei-Yao Chiu
A fast regularity measure for surface defect detection. Mach. Vis. Appl. 23 (5) (2012)
Wei-Yao Chiu, Du-Ming Tsai
ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds. GRAPP/IVAPP (2012)
Du-Ming Tsai, Hsin-Yang Tsai
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis. Mach. Vis. Appl. 22 (4) (2011)
Du-Ming Tsai, Chung-Chan Lin
Fuzzy C-means based clustering for linearly and nonlinearly separable data. Pattern Recognit. 44 (8) (2011)
Wei-Chen Li, Du-Ming Tsai
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection. IEEE Trans. Ind. Informatics 7 (1) (2011)
Du-Ming Tsai, Jie-Yu Luo
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces. IEEE Trans. Ind. Informatics 7 (1) (2011)
Ya-Hui Tsai, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu, Ming-Chin Lin
Surface defect detection of 3D objects using robot vision. Ind. Robot 38 (4) (2011)
Du-Ming Tsai, Wei-Yao Chiu
A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection. UIC/ATC Workshops (2010)
Shin-Min Chao, Du-Ming Tsai
An improved anisotropic diffusion model for detail- and edge-preserving smoothing. Pattern Recognit. Lett. 31 (13) (2010)
Wei-Yao Chiu, Du-Ming Tsai
A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences. EURASIP J. Adv. Signal Process. 2010 (2010)
Du-Ming Tsai, Chih-Chieh Chang, Shin-Min Chao
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion. Image Vis. Comput. 28 (3) (2010)
Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu, Wei-Chen Li
Anisotropic diffusion-based detail-preserving smoothing for image restoration. ICIP (2010)
Yan-Hsin Tseng, Du-Ming Tsai
Defect detection of uneven brightness in low-contrast images using basis image representation. Pattern Recognit. 43 (3) (2010)
Shin-Min Chao, Du-Ming Tsai
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images. Pattern Recognit. 43 (5) (2010)
Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces. ICPR (2010)
Du-Ming Tsai, Shia-Chih Lai
Independent Component Analysis-Based Background Subtraction for Indoor Surveillance. IEEE Trans. Image Process. 18 (1) (2009)
Du-Ming Tsai, Su-Ta Chuang
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. Mach. Vis. Appl. 20 (6) (2009)
Du-Ming Tsai, Shia-Chih Lai
Defect detection in periodically patterned surfaces using independent component analysis. Pattern Recognit. 41 (9) (2008)
Shin-Min Chao, Du-Ming Tsai
An anisotropic diffusion-based defect detection for low-contrast glass substrates. Image Vis. Comput. 26 (2) (2008)
Du-Ming Tsai, Wei-Yao Chiu
Motion detection using Fourier image reconstruction. Pattern Recognit. Lett. 29 (16) (2008)
Chi-Jie Lu, Du-Ming Tsai
Independent component analysis-based defect detection in patterned liquid crystal display surfaces. Image Vis. Comput. 26 (7) (2008)
Du-Ming Tsai, Chih-Chia Kuo
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction. Mach. Vis. Appl. 18 (6) (2007)
Shin-Min Chao, Du-Ming Tsai
Astronomical image restoration using an improved anisotropic diffusion. Pattern Recognit. Lett. 27 (5) (2006)
Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang
Defect detection in low-contrast glass substrates using anisotropic diffusion. ICPR (1) (2006)
Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen
Independent component analysis based filter design for defect detection in low-contrast textured images. ICPR (2) (2006)
Du-Ming Tsai, Ping-Chieh Lin, Chi-Jie Lu
An independent component analysis-based filter design for defect detection in low-contrast surface images. Pattern Recognit. 39 (9) (2006)
Du-Ming Tsai, Ron-Hwa Yang
An eigenvalue-based similarity measure and its application in defect detection. Image Vis. Comput. 23 (12) (2005)
Erwie Zahara, Shu-Kai S. Fan, Du-Ming Tsai
Optimal multi-thresholding using a hybrid optimization approach. Pattern Recognit. Lett. 26 (8) (2005)
Du-Ming Tsai, Cheng-Hsiang Yang
A quantile-quantile plot based pattern matching for defect detection. Pattern Recognit. Lett. 26 (13) (2005)
Du-Ming Tsai, Shin-Min Chao
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. Image Vis. Comput. 23 (3) (2005)
Du-Ming Tsai, Cheng-Huei Chiang
Automatic band selection for wavelet reconstruction in the application of defect detection. Image Vis. Comput. 21 (5) (2003)
Du-Ming Tsai, Chien-Ta Lin, Jeng-Fung Chen
The evaluation of normalized cross correlations for defect detection. Pattern Recognit. Lett. 24 (15) (2003)
Du-Ming Tsai, Tse-Yun Huang
Automated surface inspection for statistical textures. Image Vis. Comput. 21 (4) (2003)
Du-Ming Tsai, Chien-Ta Lin
Fast normalized cross correlation for defect detection. Pattern Recognit. Lett. 24 (15) (2003)
Du-Ming Tsai, Ya-Hui Tsai
Defect detection in textured surfaces using color ring-projection correlation. Mach. Vis. Appl. 13 (4) (2003)
Du-Ming Tsai, Ya-Hui Tsai
Rotation-invariant pattern matching with color ring-projection. Pattern Recognit. 35 (1) (2002)
Du-Ming Tsai, Cheng-Huei Chiang
Rotation-invariant pattern matching using wavelet decomposition. Pattern Recognit. Lett. 23 (1-3) (2002)
Du-Ming Tsai, Bo Hsiao
Automatic surface inspection using wavelet reconstruction. Pattern Recognit. 34 (6) (2001)
Du-Ming Tsai, Song-Kuaw Wu, Mu-Chen Chen
Optimal Gabor filter design for texture segmentation using stochastic optimization. Image Vis. Comput. 19 (5) (2001)
Du-Ming Tsai, Huei-Tse Hou, H.-J. Su
Boundary-based corner detection using eigenvalues of covariance matrices. Pattern Recognit. Lett. 20 (1) (1999)
Mu-Chen Chen, Du-Ming Tsai, Hsien-Yu Tseng
A stochastic optimization approach for roundness measurement. Pattern Recognit. Lett. 20 (7) (1999)
Du-Ming Tsai, Chi-Fong Tseng
Surface roughness classification for castings. Pattern Recognit. 32 (3) (1999)
Du-Ming Tsai, C.-Y. Hsieh
Automated surface inspection for directional textures. Image Vis. Comput. 18 (1) (1999)
Du-Ming Tsai, Chin-Tun Lin
A moment-preserving approach for depth from defocus. Pattern Recognit. 31 (5) (1998)
Du-Ming Tsai, Hu-Jong Wang
Segmenting focused objects in complex visual images. Pattern Recognit. Lett. 19 (10) (1998)
Du-Ming Tsai
Boundary-based corner detection using neural networks. Pattern Recognit. 30 (1) (1997)
Du-Ming Tsai
An improved generalized Hough transform for the recognition of overlapping objects. Image Vis. Comput. 15 (12) (1997)
Du-Ming Tsai, Tsai Ray-Yuan
Use neural networks to determine matching order for recognizing overlapping objects. Pattern Recognit. Lett. 17 (10) (1996)
Du-Ming Tsai, Ming-fong Chen
Object recognition by a linear weight classifier. Pattern Recognit. Lett. 16 (6) (1995)
Du-Ming Tsai
A fast thresholding selection procedure for multimodal and unimodal histograms. Pattern Recognit. Lett. 16 (6) (1995)
Du-Ming Tsai
A three-dimensional machine-vision approach for automatic robot programming. J. Intell. Robotic Syst. 12 (1) (1995)
Du-Ming Tsai, Ming-fong Chen
Curve fitting approach for tangent angle and curvature measurements. Pattern Recognit. 27 (5) (1994)
Du-Ming Tsai, Ying-Hsiung Chen
A fast histogram-clustering approach for multi-level thresholding. Pattern Recognit. Lett. 13 (4) (1992)