Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces.
Du-Ming TsaiJie-Yu LuoPublished in: IEEE Trans. Ind. Informatics (2011)
Keyphrases
- mean shift
- defect detection
- textured surfaces
- object tracking
- graph cuts
- three dimensional
- particle filter
- visual tracking
- feature extraction
- mode seeking
- density function
- kernel density
- sift features
- partial occlusion
- bilateral filtering
- kalman filter
- color histogram
- kernel density estimation
- feature space
- sampling procedure
- color image segmentation
- target tracking
- image segmentation algorithm
- region merging
- image processing
- uni modal
- object localisation