SIFT FEATURES
Experts
- Qi Tian
- Srinivasan Parthasarathy
- Ilya P. Razenshteyn
- Leonard Barolli
- Andrzej Sluzek
- Katja Ludwig
- Rainer Lienhart
- Jiantao Zhou
- Rasmus Pagh
- Masafumi Yamada
- Keita Matsuo
- Miralda Cuka
- Jitendra Malik
- J. M. Hans du Buf
- Eduard Sojka
- Yi Liu
- Una-May O'Reilly
- Roberto Caldelli
- Kanav Vats
- Yongdong Zhang
- Alexandr Andoni
- Irene Amerini
- Lianyong Qi
- Thijs Laarhoven
- Qiang Wang
- Aniket Chakrabarti
- Jianlin Feng
- Jun Guo
- Rajeev Motwani
- Brian Kulis
- Alexander Wong
- Toshinori Watanabe
- Julian Lorenz
- Hisashi Koga
- William J. McNally
- Zhiyuan Guo
- Milan Surkala
- Tetsuya Oda
- Gang Liu
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICPR
- ICASSP
- ICCV
- ICRA
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- SMC
- IROS
- IEEE Trans. Inf. Forensics Secur.
- EMBC
- Sensors
- Proc. VLDB Endow.
- Pattern Recognit.
- Remote. Sens.
- IEEE Trans. Image Process.
- IET Image Process.
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis.
- ICME
- IEEE Geosci. Remote. Sens. Lett.
- IEICE Trans. Inf. Syst.
- ICIMCS
- Int. J. Pattern Recognit. Artif. Intell.
- ICMR
- J. Electronic Imaging
- ACIVS
- 计算机科学
- Inf. Sci.
- ICDE
- ITCS
- PCM
- ICDAR
- WACV
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