SIFT FEATURES
Experts
- Qi Tian
- Srinivasan Parthasarathy
- Leonard Barolli
- Ilya P. Razenshteyn
- Andrzej Sluzek
- Eduard Sojka
- Miralda Cuka
- J. M. Hans du Buf
- Yi Liu
- Rainer Lienhart
- Katja Ludwig
- Keita Matsuo
- Masafumi Yamada
- Rasmus Pagh
- Jiantao Zhou
- Jitendra Malik
- Yongdong Zhang
- Jianlin Feng
- Zhiyuan Guo
- Brian Kulis
- Julian Lorenz
- Hisashi Koga
- Lianyong Qi
- Andrea Costanzo
- Roberto Caldelli
- Toshinori Watanabe
- Rajeev Motwani
- Aniket Chakrabarti
- Hongtao Xie
- Alexandr Andoni
- Milan Surkala
- Una-May O'Reilly
- Thijs Laarhoven
- Jun Guo
- Qiang Wang
- Irene Amerini
- Alexander Wong
- Kanav Vats
- William J. McNally
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICRA
- ICPR
- ICASSP
- ICCV
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- Sensors
- IEEE Trans. Inf. Forensics Secur.
- IROS
- Proc. VLDB Endow.
- Remote. Sens.
- SMC
- EMBC
- IET Image Process.
- CVPR Workshops
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- ICIMCS
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- ICME
- IEICE Trans. Inf. Syst.
- Inf. Sci.
- Int. J. Pattern Recognit. Artif. Intell.
- 计算机科学
- J. Electronic Imaging
- ICMR
- ACIVS
- IEEE Trans. Circuits Syst. Video Technol.
- ICDE
- IEEE Trans. Multim.
- CISP-BMEI
- ICDAR
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