SIFT FEATURES
Experts
- Qi Tian
- Srinivasan Parthasarathy
- Ilya P. Razenshteyn
- Leonard Barolli
- Keita Matsuo
- Andrzej Sluzek
- Jiantao Zhou
- Eduard Sojka
- Masafumi Yamada
- Katja Ludwig
- Miralda Cuka
- Jitendra Malik
- J. M. Hans du Buf
- Yi Liu
- Rainer Lienhart
- Rasmus Pagh
- Julian Lorenz
- Alexander Wong
- Toshinori Watanabe
- Andrea Costanzo
- Aniket Chakrabarti
- Tetsuya Oda
- Alexandr Andoni
- Una-May O'Reilly
- Rajeev Motwani
- Roberto Caldelli
- Jianlin Feng
- Irene Amerini
- Kanav Vats
- William J. McNally
- Milan Surkala
- Lianyong Qi
- Jun Guo
- Hisashi Koga
- Hongtao Xie
- Thijs Laarhoven
- Brian Kulis
- Yongdong Zhang
- Qiang Wang
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICRA
- ICPR
- ICCV
- ICASSP
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- IGARSS
- Proc. VLDB Endow.
- IROS
- Remote. Sens.
- IEEE Trans. Inf. Forensics Secur.
- EMBC
- SMC
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR Workshops
- IEEE Trans. Image Process.
- IET Image Process.
- ICME
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- IEICE Trans. Inf. Syst.
- ICIMCS
- ACIVS
- ICMR
- 计算机科学
- J. Electronic Imaging
- Int. J. Pattern Recognit. Artif. Intell.
- Inf. Sci.
- IEEE Trans. Circuits Syst. Video Technol.
- ICDE
- IJCNN
- Pattern Recognit. Lett.
- PCM
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