SIFT FEATURES
Experts
- Qi Tian
- Srinivasan Parthasarathy
- Leonard Barolli
- Ilya P. Razenshteyn
- J. M. Hans du Buf
- Masafumi Yamada
- Keita Matsuo
- Rainer Lienhart
- Eduard Sojka
- Jiantao Zhou
- Jitendra Malik
- Miralda Cuka
- Andrzej Sluzek
- Katja Ludwig
- Yi Liu
- Rasmus Pagh
- Gang Liu
- Hongtao Xie
- Zhiyuan Guo
- William J. McNally
- Milan Surkala
- Kanav Vats
- Andrea Costanzo
- Aniket Chakrabarti
- Qiang Wang
- Alexandr Andoni
- Una-May O'Reilly
- Hisashi Koga
- Rajeev Motwani
- Irene Amerini
- Julian Lorenz
- Toshinori Watanabe
- Roberto Caldelli
- Thijs Laarhoven
- Alexander Wong
- Lianyong Qi
- Yongdong Zhang
- Jianlin Feng
- Tetsuya Oda
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- ICRA
- ICPR
- CVPR
- ICCV
- ICASSP
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- Sensors
- EMBC
- IEEE Trans. Inf. Forensics Secur.
- Proc. VLDB Endow.
- Remote. Sens.
- SMC
- IROS
- IEEE Trans. Image Process.
- IET Image Process.
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR Workshops
- ICIMCS
- IEICE Trans. Inf. Syst.
- ICME
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Comput. Vis.
- Inf. Sci.
- ICMR
- Int. J. Pattern Recognit. Artif. Intell.
- ICDE
- IEEE Trans. Circuits Syst. Video Technol.
- J. Electronic Imaging
- ACIVS
- 计算机科学
- ISVC (1)
- Pattern Recognit. Lett.
- ISVC (2)
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