SAMPLING PROCEDURE
Experts
- Srikanta Tirthapura
- Peter Meer
- David R. Karger
- Youness Aliyari Ghassabeh
- Bojian Xu
- Mustapha Lebbah
- Trong Duc Nguyen
- Cem Kadilar
- Ming-Hung Shih
- Kenneth L. Clarkson
- Gilles Schaeffer
- Leonard Barolli
- Keita Matsuo
- Atsushi Imiya
- Divesh Srivastava
- Doron Rotem
- Iris Fermin
- Frank Olken
- Miralda Cuka
- Masafumi Yamada
- Lorenz Hübschle-Schneider
- Bernd Gärtner
- Tarn Duong
- Peter Sanders
- Olivier Bodini
- Eduard Sojka
- Yi Liu
- Gaël Beck
- Saeed Alaei
- Thomas Grenier
- Dominique Poulalhon
- Hulya Cingi
- Milan Surkala
- Tomoki Ueno
- Éric Fusy
- Azarakhsh Malekian
- Avinash Prasad
- David P. Woodruff
- Tetsuya Oda
Venues
- CoRR
- Commun. Stat. Simul. Comput.
- ICASSP
- ICIP
- Sensors
- Pattern Recognit. Lett.
- IEEE Access
- SODA
- Pattern Recognit.
- IGARSS
- EUSIPCO
- STOC
- CVPR
- Inf. Process. Lett.
- ISCAS
- ACM Trans. Math. Softw.
- Eur. J. Oper. Res.
- Appl. Math. Comput.
- Model. Assist. Stat. Appl.
- SDM
- IROS
- Kybernetika
- IEEE Trans. Knowl. Data Eng.
- IACR Cryptol. ePrint Arch.
- Random Struct. Algorithms
- AAAI
- IEEE Trans. Pattern Anal. Mach. Intell.
- SIGMOD Conference
- Signal Process.
- Entropy
- Axioms
- Electron. Colloquium Comput. Complex.
- AISTATS
- IJCNN
- IEEE Trans. Instrum. Meas.
- ICALP
- Algorithmica
- Theor. Comput. Sci.
- Inf. Sci.
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