OBJECT TRACKING
Experts
- Huchuan Lu
- Ming-Hsuan Yang
- Petar M. Djuric
- Luc Van Gool
- Weiming Hu
- Andrea Cavallaro
- Lyudmila Mihaylova
- Haibin Ling
- Mubarak Shah
- Dong Wang
- Rama Chellappa
- Larry S. Davis
- Jiri Matas
- Uwe D. Hanebeck
- Jenq-Neng Hwang
- Nassir Navab
- Fredrik Gustafsson
- Zhenyu He
- Carlo S. Regazzoni
- Horst Bischof
- Marcus Baum
- Mónica F. Bugallo
- Patrick Bouthemy
- Thomas S. Huang
- Yaakov Bar-Shalom
- Chenglong Li
- Pascal Fua
- Peter Willett
- Changhong Fu
- Guillaume-Alexandre Bilodeau
- Simon J. Godsill
- Marc Pollefeys
- Martin Danelljan
- Jin Tang
- Rita Cucchiara
- Fatih Porikli
- Yanning Zhang
- Ioannis Pitas
- Kaiqi Huang
Venues
- CoRR
- Sensors
- FUSION
- IEEE Access
- ICRA
- ICIP
- IROS
- ICASSP
- CVPR
- ACC
- ICPR
- CDC
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- IEEE Trans. Circuits Syst. Video Technol.
- Neurocomputing
- AVSS
- ICCV
- EUSIPCO
- IEEE Trans. Signal Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ICME
- BMVC
- CVPR Workshops
- Autom.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Instrum. Meas.
- Signal Process.
- Remote. Sens.
- Image Vis. Comput.
- IEEE Trans. Autom. Control.
- Comput. Vis. Image Underst.
- ROBIO
- IGARSS
- ITSC
- EMBC
- Pattern Recognit. Lett.
- SMC
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