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Experts
- Du-Ming Tsai
- Krishnendu Chakrabarty
- Haiyong Chen
- Stefan Biffl
- Adit D. Singh
- Aytül Erçil
- Irith Pomeranz
- Bin Gao
- Rosa Rodríguez-Montañés
- Joan Figueras
- Chih-Yang Lin
- Jinhai Liu
- Nagappa U. Bhajantri
- Wei-Yao Chiu
- Stefan Wagner
- David Lo
- P. Nagabhushan
- Chuan-Yu Chang
- Liang Gao
- Aysin Ertüzün
- V. Asha
- Jürgen Münch
- Patrick Girard
- Domen Tabernik
- Shen Wang
- Wai Lok Woo
- Kun Liu
- Michel Renovell
- Fabian Vargas
- Alberto Bosio
- Danijel Skocaj
- Frank Elberzhager
- Luigi Dilillo
- Per Runeson
- Songling Huang
- Atsushi Yamashita
- Bernd Becker
- Hajime Asama
- Said Hamdioui
Venues
- CoRR
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- IEEE Trans. Instrum. Meas.
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- IEEE Trans. Ind. Informatics
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- Reliab. Eng. Syst. Saf.
- Mach. Vis. Appl.
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- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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- J. Electron. Test.
- Eng. Appl. Artif. Intell.
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- Comput. Ind.
- Pattern Recognit.
- Adv. Eng. Informatics
- Neural Comput. Appl.
- CASE
- IEEE Trans. Software Eng.
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- Neurocomputing
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- IEEE Trans. Ind. Electron.
- DATE
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- ICIP
- Empir. Softw. Eng.
- Image Vis. Comput.
- IECON
- IEEE Des. Test Comput.
- ATS
- Pattern Recognit. Lett.
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