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Experts
- Du-Ming Tsai
- Krishnendu Chakrabarty
- Haiyong Chen
- Stefan Biffl
- Aytül Erçil
- Adit D. Singh
- Irith Pomeranz
- Rosa Rodríguez-Montañés
- Joan Figueras
- Nagappa U. Bhajantri
- Aysin Ertüzün
- David Lo
- Stefan Wagner
- Chih-Yang Lin
- Bin Gao
- Chuan-Yu Chang
- Wei-Yao Chiu
- P. Nagabhushan
- V. Asha
- Jürgen Münch
- Kun Liu
- Atsushi Yamashita
- Domen Tabernik
- Per Runeson
- Michel Renovell
- Bernd Becker
- Hajime Asama
- Yuan Yao
- Majid Mirmehdi
- Danijel Skocaj
- Bram Kruseman
- Frank Elberzhager
- Patrick Girard
- Arnaud Virazel
- Fabrizio Lombardi
- Alberto Bosio
- Wai Lok Woo
- Luigi Dilillo
- Said Hamdioui
Venues
- CoRR
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- IEEE Trans. Instrum. Meas.
- IEEE Access
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- Microelectron. Reliab.
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- IEEE Trans. Ind. Informatics
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- DFT
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- Mach. Vis. Appl.
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- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- I2MTC
- J. Electron. Test.
- J. Intell. Manuf.
- Pattern Recognit.
- Neural Comput. Appl.
- Neurocomputing
- IEEE Trans. Software Eng.
- CASE
- IEEE Trans. Ind. Electron.
- Adv. Eng. Informatics
- Multim. Tools Appl.
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- Comput. Ind.
- ICPR
- Empir. Softw. Eng.
- Image Vis. Comput.
- DATE
- IEEE Des. Test Comput.
- ICIP
- ATS
- Pattern Recognit. Lett.
- IEEE SENSORS
- Asian Test Symposium
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