DEFECT DETECTION
Experts
- Du-Ming Tsai
- Krishnendu Chakrabarty
- Haiyong Chen
- Stefan Biffl
- Aytül Erçil
- Adit D. Singh
- Irith Pomeranz
- Bin Gao
- Rosa RodrÃguez-Montañés
- Stefan Wagner
- Nagappa U. Bhajantri
- V. Asha
- Chih-Yang Lin
- P. Nagabhushan
- Jinhai Liu
- Liang Gao
- Wei-Yao Chiu
- Chuan-Yu Chang
- Joan Figueras
- David Lo
- Aysin Ertüzün
- Jürgen Münch
- Fabian Vargas
- Bernd Becker
- Yuan Yao
- Atsushi Yamashita
- Kun Liu
- Luigi Dilillo
- Frank Elberzhager
- Majid Mirmehdi
- Danijel Skocaj
- Michel Renovell
- Arnaud Virazel
- Shen Wang
- Fabrizio Lombardi
- Domen Tabernik
- Bram Kruseman
- Songling Huang
- Patrick Girard
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- ITC
- Microelectron. Reliab.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- VTS
- Adv. Eng. Informatics
- IROS
- J. Intell. Manuf.
- Reliab. Eng. Syst. Saf.
- ICRA
- I2MTC
- Mach. Vis. Appl.
- DFT
- Multim. Tools Appl.
- EMBC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- J. Electron. Test.
- Neural Comput. Appl.
- Pattern Recognit.
- Neurocomputing
- IEEE Trans. Ind. Electron.
- Comput. Ind.
- CASE
- IET Image Process.
- IEEE Trans. Software Eng.
- J. Electronic Imaging
- ICSE
- CHI
- ICIP
- ICPR
- DATE
- IECON
- Image Vis. Comput.
- Empir. Softw. Eng.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend