DEFECT DETECTION
Experts
- Du-Ming Tsai
- Krishnendu Chakrabarty
- Haiyong Chen
- Stefan Biffl
- Aytül Erçil
- Adit D. Singh
- Bin Gao
- Irith Pomeranz
- Rosa Rodríguez-Montañés
- Chih-Yang Lin
- Nagappa U. Bhajantri
- Aysin Ertüzün
- P. Nagabhushan
- Wei-Yao Chiu
- Jinhai Liu
- Chuan-Yu Chang
- Joan Figueras
- Liang Gao
- David Lo
- Stefan Wagner
- V. Asha
- Patrick Girard
- Majid Mirmehdi
- Danijel Skocaj
- Wai Lok Woo
- Atsushi Yamashita
- Alberto Bosio
- Domen Tabernik
- Luigi Dilillo
- Frank Elberzhager
- Fabrizio Lombardi
- Shen Wang
- Yuan Yao
- Michel Renovell
- Songling Huang
- Fabian Vargas
- Bernd Becker
- Bram Kruseman
- Arnaud Virazel
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- ITC
- Microelectron. Reliab.
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- VTS
- IROS
- DFT
- Reliab. Eng. Syst. Saf.
- I2MTC
- Eng. Appl. Artif. Intell.
- Mach. Vis. Appl.
- ICRA
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- EMBC
- J. Electron. Test.
- J. Intell. Manuf.
- Pattern Recognit.
- Multim. Tools Appl.
- Comput. Ind.
- Adv. Eng. Informatics
- Neural Comput. Appl.
- Neurocomputing
- CASE
- IEEE Trans. Software Eng.
- ICSE
- IEEE Trans. Ind. Electron.
- ICIP
- ICPR
- DATE
- Empir. Softw. Eng.
- IECON
- Image Vis. Comput.
- Pattern Recognit. Lett.
- Comput. Ind. Eng.
- ATS
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