J. Electron. Test.

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Publications

volume 40, number 1, 2024

Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. J. Electron. Test. 40 (1) (2024)
M. N. Saranya, Rathnamala Rao
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems. J. Electron. Test. 40 (1) (2024)
Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi, Mona Safar
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach. J. Electron. Test. 40 (1) (2024)
Linsen Huang
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. J. Electron. Test. 40 (1) (2024)
Shun-Hua Yang, Shi-Yu Huang
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme. J. Electron. Test. 40 (1) (2024)
2023 JETTA Reviewers. J. Electron. Test. 40 (1) (2024)
Yuling Shang, Songyi Wei, Chunquan Li, Xiaojing Ye, Lizhen Zeng, Wei Hu, Xiang He, Jinzhuo Zhou
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis. J. Electron. Test. 40 (1) (2024)
Chen Dong, Xiao Chen, Zhenyi Chen
Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees. J. Electron. Test. 40 (1) (2024)
Vishwani D. Agrawal
Editorial. J. Electron. Test. 40 (1) (2024)
Shifeng Yu, Junjie Dai, Junhui Li
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration. J. Electron. Test. 40 (1) (2024)
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. J. Electron. Test. 40 (1) (2024)
Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. J. Electron. Test. 40 (1) (2024)

volume 40, number 2, 2024

volume 40, number 3, 2024

volume 39, number 4, 2023

volume 39, number 5, 2023