J. Electron. Test.

Keyphrases

Publications

volume 39, number 1, 2023

Raghavendra Kumar Sakali, Sk. Noor Mahammad
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm. J. Electron. Test. 39 (1) (2023)
Bahareh Asadi, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey. J. Electron. Test. 39 (1) (2023)
Jake Elliot, Jason Brown
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends. J. Electron. Test. 39 (1) (2023)
Vishwani D. Agrawal
Editorial. J. Electron. Test. 39 (1) (2023)
Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit. J. Electron. Test. 39 (1) (2023)
Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich
Identifying Resistive Open Defects in Embedded Cells under Variations. J. Electron. Test. 39 (1) (2023)
Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram. J. Electron. Test. 39 (1) (2023)
Sourav Ghosh, Surajit Kumar Roy, Chandan Giri
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation. J. Electron. Test. 39 (1) (2023)

volume 39, number 2, 2023

volume 39, number 3, 2023

volume 39, number 4, 2023

volume 39, number 5, 2023