Soham Roy

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 14

Top Topics

Pattern Generator

Metal Oxide Semiconductor

Human Intelligence

Test Generation

Top Venues

J. Electron. Test.

IACR Cryptol. ePrint Arch.

Publications

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. J. Electron. Test. 40 (2) (2024)
Soham Roy, Vishwani D. Agrawal
An Amalgamated Testability Measure Derived from Machine Intelligence. VLSID (2024)
Soham Roy, Anubhab Baksi, Anupam Chattopadhyay
Quantum Implementation of ASCON Linear Layer. IACR Cryptol. ePrint Arch. 2023 (2023)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. VTS (2021)
Rajdeep Chatterjee, Soham Roy, SK Hafizul Islam
Trident U-Net: An Encoder Fusion for Improved Biomedical Image Segmentation. BIOMESIP (2021)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Unsupervised Learning in Test Generation for Digital Integrated Circuits. ETS (2021)
Mrityunjoy Dey, Shoif Md Mia, Navonil Sarkar, Archan Bhattacharya, Soham Roy, Samir Malakar, Ram Sarkar
A two-stage CNN-based hand-drawn electrical and electronic circuit component recognition system. Neural Comput. Appl. 33 (20) (2021)
Nachiketa Tarasia, Amulya Ratna Swain, Soham Roy, Udit Narayana Kar
Improved Localized Sleep Scheduling Techniques to Prolong WSN Lifetime. Scalable Comput. Pract. Exp. 22 (1) (2021)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. VLSI Design (2021)
Soham Roy, Archan Bhattacharya, Navonil Sarkar, Samir Malakar, Ram Sarkar
Offline hand-drawn circuit component recognition using texture and shape-based features. Multim. Tools Appl. 79 (41-42) (2020)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Machine Intelligence for Efficient Test Pattern Generation. ITC (2020)
Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electron. Test. 36 (1) (2020)
Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. NATW (2019)
Spencer K. Millican, Yang Sun, Soham Roy, Vishwani D. Agrawal
Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training. ATS (2019)