Unsupervised Learning in Test Generation for Digital Integrated Circuits.
Soham RoySpencer K. MillicanVishwani D. AgrawalPublished in: ETS (2021)
Keyphrases
- integrated circuit
- test generation
- unsupervised learning
- test cases
- symbolic execution
- supervised learning
- test sequences
- design automation
- static analysis
- electron beam
- software testing
- metal oxide semiconductor
- quality assurance
- dimensionality reduction
- open source
- machine learning
- database
- low cost
- artificial intelligence
- quality control
- semi supervised
- active learning
- object recognition
- circuit design
- feature selection
- test data generation
- databases
- data sets
- code coverage