TEST SEQUENCES
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gordon Fraser
- Tsong Yueh Chen
- Mike Papadakis
- Robert M. Hierons
- Yves Le Traon
- Gregg Rothermel
- Vishwani D. Agrawal
- Andrea Arcuri
- Tao Xie
- Krishnendu Chakrabarty
- Lionel C. Briand
- Hasan Ural
- Hideo Fujiwara
- Seiji Kajihara
- Jacob A. Abraham
- Kewal K. Saluja
- Prabhat Mishra
- Mark Harman
- Xiaoqing Wen
- Bernhard K. Aichernig
- Matteo Sonza Reorda
- Melvin A. Breuer
- Raimund Ubar
- Lingming Zhang
- Nina Yevtushenko
- Yoshinobu Higami
- Zhenyu Chen
- Lu Zhang
- Sandeep K. Gupta
- Janak H. Patel
- Andy Zaidman
- Dan Hao
- Gregory Gay
- Inmaculada Medina-Bulo
- Dave Towey
- Yuzo Takamatsu
- Alexandre Petrenko
Venues
- CoRR
- ITC
- ICST
- ICST Workshops
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Inf. Theory
- VTS
- Discret. Math.
- Inf. Softw. Technol.
- IEEE Trans. Software Eng.
- Softw. Test. Verification Reliab.
- ASE
- DAC
- Asian Test Symposium
- IEEE Trans. Computers
- J. Syst. Softw.
- ICSE
- ISSTA
- DATE
- J. Electron. Test.
- VLSI Design
- ICCAD
- ESEC/SIGSOFT FSE
- ISSRE
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- SEKE
- ACM Trans. Design Autom. Electr. Syst.
- QSIC
- SETA
- Softw. Qual. J.
- Theor. Comput. Sci.
- QRS
- IEEE Trans. Very Large Scale Integr. Syst.
- ISIT
- ACM Trans. Softw. Eng. Methodol.
- IEEE Access
- ICTSS
- Electron. J. Comb.
- ATS
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