Jacob A. Abraham

ORCID

Publication Activity (10 Years)

Years Active: 1974-2023
Publications (10 Years): 43

Top Venues

Publications

Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee, Jacob A. Abraham
Secure Control Loop Execution of Cyber-Physical Devices Using Predictive State Space Checks. ISQED (2023)
Laith Mohammad Abualigah, Mohammad Shehab, Ali Diabat, Jacob A. Abraham
Selection scheme sensitivity for a hybrid Salp Swarm Algorithm: analysis and applications. Eng. Comput. 38 (2) (2022)
Suvadeep Banerjee, Balavinayagam Samynathan, Jacob A. Abraham, Abhijit Chatterjee
Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding. IEEE Trans. Dependable Secur. Comput. 18 (2) (2021)
Phuoc Pham, Jacob A. Abraham, Jaeyong Chung
Training Multi-bit Quantized and Binarized Networks with A Learnable Symmetric Quantizer. CoRR (2021)
Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham
A Proactive System for Voltage-Droop Mitigation in a 7-nm Hexagon™ Processor. IEEE J. Solid State Circuits 56 (4) (2021)
Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham
A Current and Temperature Limiting System in a 7-nm Hexagon™ Compute Digital Signal Processor. IEEE J. Solid State Circuits 56 (3) (2021)
Phuoc Pham, Jacob A. Abraham, Jaeyong Chung
Training Multi-Bit Quantized and Binarized Networks with a Learnable Symmetric Quantizer. IEEE Access 9 (2021)
Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham
A Proactive Voltage-Droop-Mitigation System in a 7nm Hexagon™ Processor. VLSI Circuits (2020)
Byoungho Kim, Jacob A. Abraham
Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters. IEEE Access 8 (2020)
Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob A. Abraham
Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor. ITC (2020)
Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham
Randomized Pulse-Modulating Instruction-Issue Control Circuit for a Current and Temperature Limiting System in a 7nm Hexagon™ Compute DSP. CICC (2020)
Eric Cheng, Daniel Mueller-Gritschneder, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Deming Chen, Hyungmin Cho, Yanjing Li, Uzair Sharif, Kevin Skadron, Mircea Stan, Ulf Schlichtmann, Subhasish Mitra
Cross-Layer Resilience: Challenges, Insights, and the Road Ahead. DAC (2019)
Jacob A. Abraham
Resiliency Demands on Next Generation Critical Embedded Systems. IOLTS (2019)
Byoungho Kim, Jacob A. Abraham
Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications. IEEE Trans. Ind. Electron. 66 (1) (2019)
Jie Fang, Chaoming Zhang, Frank Singor, Jacob A. Abraham
A Broadband CMOS RF Front End for Direct Sampling Satellite Receivers. IEEE J. Solid State Circuits 54 (8) (2019)
Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee
Cross-Layer Control Adaptation for Autonomous System Resilience. IOLTS (2018)
Ninghan Tian, Daniel G. Saab, Jacob A. Abraham
ESIFT: Efficient System for Error Injection. IOLTS (2018)
Ameya Chaudhari, Jacob A. Abraham
Effective Control Flow Integrity Checks for Intrusion Detection. IOLTS (2018)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (9) (2018)
Jie Fang, Shankar Thirunakkarasu, Xuefeng Yu, Fabian Silva-Rivas, Chaoming Zhang, Frank Singor, Jacob A. Abraham
A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2017)
Vijay Kiran Kalyanam, Peter G. Sassone, Jacob A. Abraham
Power prediction of embedded scalar and vector processor: Challenges and solutions. ISQED (2017)
Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD (2017)
Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee
Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. IOLTS (2017)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). CoRR (2017)
Tong Zhang, Daniel G. Saab, Jacob A. Abraham
Automatic Assertion Generation for Simulation, Formal Verification and Emulation. ISVLSI (2017)
Jacob A. Abraham
Cross-layer resilience: are high-level techniques always better? HLDVT (2016)
Immanuel Raja, Gaurab Banerjee, Mohamad A. Zeidan, Jacob A. Abraham
A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 24 (5) (2016)
Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham
Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC (2016)
Harini Bhamidipati, Daniel G. Saab, Jacob A. Abraham
Single Trojan injection model generation and detection. LATS (2016)
Jacob A. Abraham, Abhijit Chatterjee
Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. VLSI Design (2016)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. CoRR (2016)
Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham
Checksum based error detection in linearized representations of non linear control systems. LATS (2016)
Shih-Hsin Hu, Jacob A. Abraham
Quality Aware Error Detection in 2-D Separable Linear Transformation. ATS (2016)
Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker
Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. VTS (2016)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Clear: c̲ross-l̲ayer e̲xploration for a̲rchitecting r̲esilience combining hardware and software techniques to tolerate soft errors in processor cores. DAC (2016)
Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham
Efficient soft error vulnerability estimation of complex designs. DATE (2015)
Gregory Ford, Aswin Krishna, Jacob A. Abraham, Daniel G. Saab
Formal Verification ATPG Search Engine Emulator (Abstract Only). FPGA (2015)
Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham
In-depth soft error vulnerability analysis using synthetic benchmarks. VTS (2015)
Hsun-Cheng Lee, Jacob A. Abraham
Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction. J. Electron. Test. 31 (2) (2015)
Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian
The future of fault tolerant computing. IOLTS (2015)
Jacob A. Abraham, Abhijit Chatterjee
Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. VLSI Design (2015)
Vijay Kiran Kalyanam, Martin Saint-Laurent, Jacob A. Abraham
Power-aware multi-voltage custom memory models for enhancing RTL and low power verification. ICCD (2015)
Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham
Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Trans. Electron. (10) (2015)
Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham
Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS (2014)
Byoungho Kim, Jacob A. Abraham
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. IEEE Trans. Circuits Syst. II Express Briefs (10) (2014)
Marc Snir, Robert W. Wisniewski, Jacob A. Abraham, Sarita V. Adve, Saurabh Bagchi, Pavan Balaji, Jim Belak, Pradip Bose, Franck Cappello, Bill Carlson, Andrew A. Chien, Paul Coteus, Nathan DeBardeleben, Pedro C. Diniz, Christian Engelmann, Mattan Erez, Saverio Fazzari, Al Geist, Rinku Gupta, Fred Johnson, Sriram Krishnamoorthy, Sven Leyffer, Dean Liberty, Subhasish Mitra, Todd S. Munson, Rob Schreiber, Jon Stearley, Eric Van Hensbergen
Addressing failures in exascale computing. Int. J. High Perform. Comput. Appl. 28 (2) (2014)
Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE (2014)
Shahrzad Mirkhani, Jacob A. Abraham
Fast evaluation of test vector sets using a simulation-based statistical metric. VTS (2014)
Hsun-Cheng Lee, Jacob A. Abraham
Harmonic distortion correction for 8-bit delay line ADC using gray code. LATW (2014)
Shahrzad Mirkhani, Jacob A. Abraham
EAGLE: A regression model for fault coverage estimation using a simulation based metric. ITC (2014)
Hsun-Cheng Lee, Jacob A. Abraham
A novel low power 11-bit hybrid ADC using flash and delay line architectures. DATE (2014)
Shakeel S. Abdulla, Haewoon Nam, Jacob A. Abraham
A novel algorithm for sparse FFT pruning and its applications to OFDMA technology. IPCCC (2014)
Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda
Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? VTS (2014)
Byoungho Kim, Jacob A. Abraham
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits. IEEE Trans. Circuits Syst. II Express Briefs (5) (2014)
Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham
Rethinking error injection for effective resilience. ASP-DAC (2014)
Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham
Enhanced algorithm of combining trace and scan signals in post-silicon validation. VTS (2013)
Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham
Real-time checking of linear control systems using analog checksums. IOLTS (2013)
Jaeyong Chung, Jacob A. Abraham
Concurrent Path Selection Algorithm in Statistical Timing Analysis. IEEE Trans. Very Large Scale Integr. Syst. 21 (9) (2013)
Byoungho Kim, Jacob A. Abraham
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs (5) (2013)
Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas
Special session 12B: Panel post-silicon validation & test in huge variance era. VTS (2013)
Vinod Viswanath, Rajeev Muralidhar, Harinarayanan Seshadri, Jacob A. Abraham
On a rewriting strategy for dynamically managing power constraints and power dissipation in SoCs. ISQED (2013)
Hsun-Cheng Lee, Jacob A. Abraham
Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Asian Test Symposium (2013)
Jaeyong Chung, Joonsung Park, Jacob A. Abraham
A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. IEEE Trans. Very Large Scale Integr. Syst. 21 (2) (2013)
Mahesh Prabhu, Jacob A. Abraham
Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults. ITC (2013)
Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra
Quantitative evaluation of soft error injection techniques for robust system design. DAC (2013)
Ameya Chaudhari, Junyoung Park, Jacob A. Abraham
A framework for low overhead hardware based runtime control flow error detection and recovery. VTS (2013)
Mohamad A. Zeidan, Gaurab Banerjee, Jacob A. Abraham
Asynchronous Measurement of Transient Phase-Shift Resulting From RF Receiver State-Change. IEEE Trans. Circuits Syst. I Regul. Pap. (10) (2013)
Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham
Dynamic Trace Signal Selection for Post-Silicon Validation. VLSI Design (2013)
Junyoung Park, Ameya Chaudhari, Jacob A. Abraham
Non-speculative double-sampling technique to increase energy-efficiency in a high-performance processor. DATE (2013)
Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham
An oscillation-based test structure for timing information extraction. VTS (2012)
Jaeyong Chung, Jacob A. Abraham
On Computing Criticality in Refactored Timing Graphs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (12) (2012)
Mohamad A. Zeidan, Gaurab Banerjee, Ranjit Gharpurey, Jacob A. Abraham
Phase-Aware Multitone Digital Signal Based Test for RF Receivers. IEEE Trans. Circuits Syst. I Regul. Pap. (9) (2012)
Byoungho Kim, Jacob A. Abraham
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs (11) (2012)
Hyunjin Kim, Jacob A. Abraham
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement. J. Electron. Test. 28 (5) (2012)
Hyunjin Kim, Jacob A. Abraham
On-chip source synchronous interface timing test scheme with calibration. DATE (2012)
Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham
Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (4) (2012)
Hyunjin Kim, Jacob A. Abraham
A Built-In Self-Test scheme for DDR memory output timing test and measurement. VTS (2012)
Baker Mohammad, Jacob A. Abraham
A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory. Microelectron. J. 43 (2) (2012)
Ji Hwan (Paul) Chun, Siew Mooi Lim, Shao Chee Ong, Jae Wook Lee, Jacob A. Abraham
Test of phase interpolators in high speed I/Os using a sliding window search. VTS (2012)
Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham
Indirect method for random jitter measurement on SoCs using critical path characterization. ETS (2012)
Mahesh Prabhu, Jacob A. Abraham
Functional test generation for hard to detect stuck-at faults using RTL model checking. ETS (2012)
Jaeyong Chung, Jacob A. Abraham
Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (4) (2012)
Junyoung Park, H. Mert Ustun, Jacob A. Abraham
Run-time Prediction of the Optimal Performance Point in DVS-based Dynamic Thermal Management. VLSI Design (2012)
Vinod Viswanath, Jacob A. Abraham
Automatic and Correct Register Transfer Level Annotations for Low Power Microprocessor Design. J. Low Power Electron. 8 (4) (2012)
Junyoung Park, Jacob A. Abraham
An aging-aware flip-flop design based on accurate, run-time failure prediction. VTS (2012)
Xiao Pu, Krishnaswamy Nagaraj, Jacob A. Abraham, Axel Thomsen
A Novel fractional-n PLL Based on a Simple Reference Multiplier. J. Circuits Syst. Comput. 21 (6) (2012)
Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow
FALCON: Rapid statistical fault coverage estimation for complex designs. ITC (2012)
Sachin Dileep Dasnurkar, Jacob A. Abraham
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing. J. Electron. Test. 28 (5) (2012)
Ameya Chaudhari, Jacob A. Abraham
Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors. IOLTS (2012)
Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham
Testability-Driven Statistical Path Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (8) (2012)
Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham
Built-in Self Test of RF Subsystems with Integrated Detectors. J. Electron. Test. 28 (5) (2012)
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27 (3) (2011)
Hyunjin Kim, Jacob A. Abraham
On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. Asian Test Symposium (2011)
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27 (4) (2011)
Junyoung Park, Jacob A. Abraham
A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems. ISLPED (2011)
Byoungho Kim, Jacob A. Abraham
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2011)
Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham
Efficient and product-representative timing model validation. VTS (2011)
Ramtilak Vemu, Jacob A. Abraham
CEDA: Control-Flow Error Detection Using Assertions. IEEE Trans. Computers 60 (9) (2011)
Byoungho Kim, Jacob A. Abraham
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. IEEE Trans. Instrum. Meas. 60 (6) (2011)
Tung-Yeh Wu, Shih-Hsin Hu, Jacob A. Abraham
Robust power gating reactivation by dynamic wakeup sequence throttling. ASP-DAC (2011)

Jacob A. Abraham.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Jacob A. Abraham