Kihyuk Han

Publication Activity (10 Years)

Years Active: 2009-2013
Publications (10 Years): 0

Top Topics

Dynamically Select

Compressive Sensing

Top Venues

Publications

Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham
Enhanced algorithm of combining trace and scan signals in post-silicon validation. VTS (2013)
Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham
Dynamic Trace Signal Selection for Post-Silicon Validation. VLSI Design (2013)
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27 (4) (2011)
Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium (2010)
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. ETS (2009)