ETS

Keyphrases

Publications

2023

Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler
Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. ETS (2023)
L. Ammoura, Marie-Lise Flottes, Patrick Girard, Jean-Philippe Noel, Arnaud Virazel
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture. ETS (2023)
Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl
Counterfeit Detection by Semiconductor Process Technology Inspection. ETS (2023)
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
Semi-Supervised Deep Learning for Microcontroller Performance Screening. ETS (2023)
Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS (2023)
Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker
Constraint-Based Automatic SBST Generation for RISC-V Processor Families. ETS (2023)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS (2023)
Deniz Kasap, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo
Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study. ETS (2023)
Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee
A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. ETS (2023)
Peter Domanski, Dirk Pflüger, Raphaël Latty
Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. ETS (2023)
Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech
Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation. ETS (2023)
Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, P. Scaramuzza, Rudolf Ullmann
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. ETS (2023)
Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks. ETS (2023)
Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui
Online Fault Detection and Diagnosis in RRAM. ETS (2023)
Asimina Koutra, Vasileios Tenentes
High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications. ETS (2023)
S. L. Tweehuysen, G. L. A. Adriaans, M. Gomony
Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model. ETS (2023)
Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev
Global Tuning for System Performance Optimization of RF MIMO Radars. ETS (2023)
Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. ETS (2023)
Zaheer Tabassam, Andreas Steininger
SET Effects on Quasi Delay Insensitive and Synchronous Circuits. ETS (2023)
Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS (2023)
Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino
EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. ETS (2023)
Alperen Bolat, Yahya Can Tugrul, Seyyid Hikmet Çelik, Sakir Sezer, Marco Ottavi, Oguz Ergin
DEV-PIM: Dynamic Execution Validation with Processing-in-Memory. ETS (2023)
Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak
Hybrid Ring Generators for In-System Test Applications. ETS (2023)
Abhishek Kumar Mishra, Anup Das, Nagarajan Kandasamy
Online Performance Monitoring of Neuromorphic Computing Systems. ETS (2023)
Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment. ETS (2023)
Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian
Automating Greybox System-Level Test Generation. ETS (2023)
Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Valentin Gutierrez, C. Dominguez, Maria Angeles Jalón, L. Carranza
A Single-Event Latchup setup for high-precision AMS circuits. ETS (2023)
Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui
Dependability of Future Edge-AI Processors: Pandora's Box. ETS (2023)
Yi He, Yanjing Li
Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems. ETS (2023)
Tao Zhang, Mark M. Tehranipoor, Farimah Farahmandi
BitFREE: On Significant Speedup and Security Applications of FPGA Bitstream Format Reverse Engineering. ETS (2023)
IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023 ETS (2023)
Marcello Traiola, Angeliki Kritikakou, Olivier Sentieys
harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs. ETS (2023)
Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Zainalabedin Navabi
Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction. ETS (2023)
Marti Alonso, David Andreu, Ramon Canal, Stefano Di Carlo, Cristiano Pegoraro Chenet, Juanjo Costa, Andreu Girones, Dimitris Gizopoulos, Vasileios Karakostas, Beatriz Otero, George Papadimitriou, Eva Rodríguez, Alessandro Savino
Validation, Verification, and Testing (VVT) of future RISC-V powered cloud infrastructures: the Vitamin-V Horizon Europe Project perspective. ETS (2023)
Brojogopal Sapui, Jonas Krautter, Mahta Mayahinia, Atousa Jafari, Dennis Gnad, Sergej Meschkov, Mehdi B. Tahoori
Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies. ETS (2023)
Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand
Approximate Communication: Balancing Performance, Power, Reliability, and Safety. ETS (2023)
Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications. ETS (2023)
Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi
An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? ETS (2023)
Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li
Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants. ETS (2023)
Athanasios Xynos, Vasileios Tenentes, Yiorgos Tsiatouhas
SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs. ETS (2023)
Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori
Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation. ETS (2023)
Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore Manikas, Kundan Nepal
Harvesting Wasted Clock Cycles for Efficient Online Testing. ETS (2023)
Yanning Ji, Ruize Wang, Kalle Ngo, Elena Dubrova, Linus Backlund
A Side-Channel Attack on a Hardware Implementation of CRYSTALS-Kyber. ETS (2023)
Khaled Galal Abdelwahab Abdelaziz, Ralph Görgen, Görschwin Fey
FINaL: Driving High-Level Fault Injection Campaigns with Natural Language. ETS (2023)
Lorenzo Masciullo, Roberto Passerone, Francesco Regazzoni, Ilia Polian
Secrets Leaking Through Quicksand: Covert Channels in Approximate Computing. ETS (2023)
Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel
On Using Cell-Aware Methodology for SRAM Bit Cell Testing. ETS (2023)
Jiaoyan Yao, Ying Zhang, Yifeng Hua, Yuanxiang Li, Jizhong Yang, Xin Chen
Spotlight: An Impairing Packet Transmission Attack Targeting Specific Node in NoC-based TCMP. ETS (2023)
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda
Evaluating the Prevalence of SFUs in the Reliability of GPUs. ETS (2023)
Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty
Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors. ETS (2023)
Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. ETS (2023)