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New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405.

Erik Jan MarinissenAdrian EvansPo-Yao ChuangMartin KeimAnshuman Chandra
Published in: ETS (2024)
Keyphrases
  • case study
  • information processing
  • test data
  • real world
  • high speed
  • genetic algorithm
  • website
  • integrity constraints
  • rapid development