Martin Keim

ORCID

Publication Activity (10 Years)

Years Active: 1994-2024
Publications (10 Years): 26

Top Venues

University of Freiburg, Freiburg im Breisgau, Germany (PHD)

Education History

University of Freiburg, Freiburg im Breisgau, Germany

PHD

Publications

Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim
MBIST-based weak bit screening method for embedded MRAM. ETS (2024)
Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim
Combining Built-In Redundancy Analysis with ECC for Memory Testing. ETS (2024)
Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. VTS (2024)
Michele Portolan, Martin Keim, J. F. Coté, Hans-Martin Von Staud
What Would Interactive Testing With 1687 Look Like? ETS (2024)
Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS (2024)
Erik Jan Marinissen, Vineet Pancholi, Po-Yao Chuang, Martin Keim
IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. VTS (2024)
Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim
Transitioning eMRAM from Pilot Project to Volume Production. ITC (2023)
Michele Portolan, Martin Keim, Jeff Rearick, Heiko Ehrenberg
Refreshing the JTAG Family. VTS (2023)
Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
Smart Hammering: A practical method of pinhole detection in MRAM memories. DATE (2023)
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. VTS (2022)
Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
IEEE P1687.1: Extending the Network Boundaries for Test. ITC (2022)
Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna
Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test 39 (5) (2022)
Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Convolutional Compaction-Based MRAM Fault Diagnosis. ETS (2021)
Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS (2021)
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. ETS (2021)
Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ITC (2020)
Michele Portolan, Jeff Rearick, Martin Keim
Linking Chip, Board, and System Test via Standards. ETS (2020)
Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC (2020)
Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang, Wu Yang
Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. ITC (2020)
Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, J.-F. Côté, Givargis Danialy, Martin Keim, Lori Schramm
IJTAG Through a Two-Pin Chip Interface. ITC (2020)
Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa
MBIST Support for Reliable eMRAM Sensing. ETS (2020)
Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan
Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. ITC-Asia (2018)
M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla
Innovative practices on memory test practice. VTS (2018)
Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim
Adapting an industrial memory BIST solution for testing CAMs. ITC-Asia (2017)
Al Crouch, Michael Laisne, Martin Keim
Generalizing Access to Instrumentation Embedded in a Semiconductor Device. Computer 50 (7) (2017)
Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak
A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. ITC (2015)
Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (9) (2014)
Martin Keim
Quo Vadis DFT? Aspekte der Technischen Informatik (2014)
Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
Industrial Application of IEEE P1687 for an Automotive Product. DSD (2013)
Martin Keim
Thinking About Adopting IEEE P1687? IEEE Des. Test 30 (5) (2013)
Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson
Re-using chip level DFT at board level. ETS (2012)
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC (2008)
Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC (2008)
Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
Automatic Test Pattern Generation for Interconnect Open Defects. VTS (2008)
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS (2007)
Wu Yang, Wu-Tung Cheng, Yu Huang, Martin Keim, Randy Klingenberg
Scan Diagnosis and Its Successful Industrial Applications. ATS (2007)
Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
Silicon Evaluation of Static Alternative Fault Models. VTS (2007)
Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC (2006)
Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC (2004)
Martin Keim, Rolf Drechsler, Bernd Becker, Michael Martin, Paul Molitor
Polynomial Formal Verification of Multipliers. Formal Methods Syst. Des. 22 (1) (2003)
Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker
Sequential n -Detection Criteria: Keep It Simple. IOLTW (2002)
Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electron. Test. 17 (1) (2001)
Piet Engelke, Bernd Becker, Martin Keim
A parameterizable fault simulator for bridging faults. ETW (2000)
Martin Keim, Nicole Drechsler, Bernd Becker
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. ASP-DAC (1999)
Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker
A scalable BIST architecture for delay faults. ETW (1999)
Bernd Becker, Martin Keim, Rolf Krieger
Hybrid Fault Simulation for Synchronous Sequential Circuits. J. Electron. Test. 15 (3) (1999)
Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker
Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm. ISMVL (1998)
Rolf Drechsler, Martin Keim, Bernd Becker
Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued Linear Expressions. ISMVL (1997)
Can Ökmen, Martin Keim, Rolf Krieger, Bernd Becker
On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. VTS (1997)
Rolf Drechsler, Martin Keim, Bernd Becker
Fault Simulation in Sequential Multi-Valued Logic Networks. ISMVL (1997)
Martin Keim, Michael Martin, Bernd Becker, Rolf Drechsler, Paul Molitor
Polynomial Formal Verification of Multipliers. VTS (1997)
Martin Keim, Bernd Becker, Birgitta Stenner
On the (non-)resetability of synchronous sequential circuits. VTS (1996)
Rolf Krieger, Bernd Becker, Martin Keim
Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy. DAC (1995)
Rolf Krieger, Bernd Becker, Martin Keim
A Hybrid Fault Simulator for Synchronous Sequential Circuits. ITC (1994)

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Publication Activity (10 Years)

Top Topics

Top Venues

Martin Keim