Login / Signup
Automatic Test Pattern Generation for Interconnect Open Defects.
Stefan Spinner
Ilia Polian
Piet Engelke
Bernd Becker
Martin Keim
Wu-Tung Cheng
Published in:
VTS (2008)
Keyphrases
</>
high speed
fully automatic
defect detection
database
real time
machine learning
learning algorithm
decision making
image processing
data driven
semi automatic