DATA DRIVEN
Experts
- Zhongsheng Hou
- Frank Allgöwer
- Simone Formentin
- Joost-Pieter Katoen
- Julian Berberich
- Schahram Dustdar
- Yoshua Bengio
- Manish Parashar
- Shen Yin
- Hiroaki Nishikawa
- Tiffany Barnes
- Oscar Pastor
- Sergey Levine
- Svetha Venkatesh
- Bernhard Rumpe
- Shi Jin
- Tsong Yueh Chen
- Aniruddha S. Gokhale
- Jordi Cabot
- John Lygeros
- Yang Liu
- Emilio Insfrán
- Lionel C. Briand
- Sergio M. Savaresi
- Toru Yamamoto
- Hao Luo
- Santu Rana
- Zhi Jin
- Gregor Engels
- Manuel Wimmer
- Yao-Wen Chang
- Dinesh Manocha
- Evangeline F. Y. Young
- Ankur Srivastava
- Sunil Gupta
- Krishnendu Chatterjee
- Chao-Kai Wen
- Richard F. Paige
- Ronghu Chi
Venues
- CoRR
- IEEE Access
- ICASSP
- Sensors
- ICRA
- CDC
- INTERSPEECH
- IROS
- ACC
- AAAI
- DAC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- CVPR
- Expert Syst. Appl.
- NeurIPS
- IEEE Trans. Ind. Electron.
- EMBC
- WSC
- ICML
- IEEE Robotics Autom. Lett.
- IJCAI
- Neurocomputing
- IEEE Trans. Ind. Informatics
- Remote. Sens.
- Bioinform.
- Autom.
- ICCAD
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Signal Process.
- SMC
- IEEE Trans. Instrum. Meas.
- Inf. Sci.
- J. Comput. Phys.
- HICSS
- ISCAS
- Entropy
- DATE
- IEEE Trans. Geosci. Remote. Sens.
- IJCNN
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