Jais Abraham

Publication Activity (10 Years)

Years Active: 2000-2024
Publications (10 Years): 4

Top Topics

Software Testing

Channel Allocation

Top Venues

Publications

Subhadip Kundu, Jais Abraham
Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. VLSID (2024)
Ankush Srivastava, Jais Abraham
Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. ITC (2022)
Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim
Adapting an industrial memory BIST solution for testing CAMs. ITC-Asia (2017)
Jais Abraham, Shankar Umapathi, Sumitha Krishnamurthi
Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation. VLSI Design (2016)
Srinivasulu Alampally, Jais Abraham, Rubin A. Parekhji, Rohit Kapur, Thomas W. Williams
Evaluation of Entropy Driven Compression Bounds on Industrial Designs. ATS (2008)
Sandeep Jain, Jais Abraham, Srinivas Kumar Vooka, Sumant Kale, Amit Dutta, Rubin A. Parekhji
Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs. VLSI Design (2007)
Jais Abraham, Uday Goel, Arun Kumar
Multi-Cycle Sensitizable Transition Delay Faults. VTS (2006)
Karanth Shankaranarayana, Soujanna Sarkar, R. Venkatraman, Shyam S. Jagini, N. Venkatesh, Jagdish C. Rao, H. Udayakumar, M. Sambandam, K. P. Sheshadri, S. Talapatra, Parag Mhatre, Jais Abraham, Rubin A. Parekhji
Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon. VLSI Design (2002)
Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji
A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. ITC (2000)