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Jais Abraham
Publication Activity (10 Years)
Years Active: 2000-2024
Publications (10 Years): 4
Top Topics
Software Testing
Hot Spots
Low Memory
Channel Allocation
Top Venues
ITC-Asia
VLSID
VLSI Design
ITC
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Publications
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Subhadip Kundu
,
Jais Abraham
Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network.
VLSID
(2024)
Ankush Srivastava
,
Jais Abraham
Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test.
ITC
(2022)
Jais Abraham
,
Uttam Garg
,
Glenn Colón-Bonet
,
Ramesh Sharma
,
Chennian Di
,
Benoit Nadeau-Dostie
,
Etienne Racine
,
Martin Keim
Adapting an industrial memory BIST solution for testing CAMs.
ITC-Asia
(2017)
Jais Abraham
,
Shankar Umapathi
,
Sumitha Krishnamurthi
Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation.
VLSI Design
(2016)
Srinivasulu Alampally
,
Jais Abraham
,
Rubin A. Parekhji
,
Rohit Kapur
,
Thomas W. Williams
Evaluation of Entropy Driven Compression Bounds on Industrial Designs.
ATS
(2008)
Sandeep Jain
,
Jais Abraham
,
Srinivas Kumar Vooka
,
Sumant Kale
,
Amit Dutta
,
Rubin A. Parekhji
Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs.
VLSI Design
(2007)
Jais Abraham
,
Uday Goel
,
Arun Kumar
Multi-Cycle Sensitizable Transition Delay Faults.
VTS
(2006)
Karanth Shankaranarayana
,
Soujanna Sarkar
,
R. Venkatraman
,
Shyam S. Jagini
,
N. Venkatesh
,
Jagdish C. Rao
,
H. Udayakumar
,
M. Sambandam
,
K. P. Sheshadri
,
S. Talapatra
,
Parag Mhatre
,
Jais Abraham
,
Rubin A. Parekhji
Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon.
VLSI Design
(2002)
Jais Abraham
,
Narayan Prasad
,
Srinivasa Chakravarthy B. S.
,
Ameet Bagwe
,
Rubin A. Parekhji
A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx.
ITC
(2000)