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Adapting an industrial memory BIST solution for testing CAMs.
Jais Abraham
Uttam Garg
Glenn Colón-Bonet
Ramesh Sharma
Chennian Di
Benoit Nadeau-Dostie
Etienne Racine
Martin Keim
Published in:
ITC-Asia (2017)
Keyphrases
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industrial applications
memory requirements
memory usage
information systems
mathematical model
closed form
computing power
neural network
social networks
database systems
image sequences
search space
control system
software testing
low memory