Login / Signup

Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs.

Sandeep JainJais AbrahamSrinivas Kumar VookaSumant KaleAmit DuttaRubin A. Parekhji
Published in: VLSI Design (2007)
Keyphrases
  • reinforcement learning
  • learning algorithm
  • real world
  • control system
  • high level
  • test data
  • built in self test
  • image processing
  • multiscale
  • computational complexity
  • computationally intensive