TEST DATA
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Sudhakar M. Reddy
- Tsong Yueh Chen
- Lionel C. Briand
- Janusz Rajski
- Matteo Sonza Reorda
- Jerzy Tyszer
- Gordon Fraser
- Seiji Kajihara
- Hideo Fujiwara
- Gregg Rothermel
- Erik Jan Marinissen
- Robert M. Hierons
- Alex Orailoglu
- Kwang-Ting Cheng
- T. H. Tse
- Mark Harman
- Atif M. Memon
- Antonia Bertolino
- Abhijit Chatterjee
- Kate Saenko
- Xiaoqing Wen
- Yervant Zorian
- Dimitris Nikolos
- Tao Xie
- Vishwani D. Agrawal
- Dave Towey
- Fabrizio Lombardi
- Paolo Tonella
- Salvador Mir
- Xiaowei Li
- Ernesto Sánchez
- Sungho Kang
- Arnaud Gotlieb
- Said Hamdioui
- Ina Schieferdecker
- Michel Renovell
- Nur A. Touba
Venues
- CoRR
- ITC
- IEEE Access
- IGARSS
- Sensors
- VTS
- Remote. Sens.
- J. Electron. Test.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Asian Test Symposium
- ICST
- ICST Workshops
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- Bioinform.
- IEEE Trans. Software Eng.
- DATE
- Comput. Stat. Data Anal.
- Microelectron. Reliab.
- IEEE Trans. Computers
- CVPR
- Commun. Stat. Simul. Comput.
- NeurIPS
- Softw. Test. Verification Reliab.
- IEEE Des. Test Comput.
- ICSE
- ASE
- ISSTA
- J. Syst. Softw.
- ATS
- Inf. Softw. Technol.
- ICML
- IJCNN
- ETS
- DAC
- VLSI Design
- EMBC
- Neurocomputing
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