TEST DATA
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Sudhakar M. Reddy
- Tsong Yueh Chen
- Janusz Rajski
- Lionel C. Briand
- Matteo Sonza Reorda
- Jerzy Tyszer
- Seiji Kajihara
- Gordon Fraser
- Hideo Fujiwara
- Erik Jan Marinissen
- Gregg Rothermel
- Robert M. Hierons
- Kwang-Ting Cheng
- Alex Orailoglu
- T. H. Tse
- Mark Harman
- Atif M. Memon
- Antonia Bertolino
- Kate Saenko
- Abhijit Chatterjee
- Xiaoqing Wen
- Yervant Zorian
- Dimitris Nikolos
- Tao Xie
- Vishwani D. Agrawal
- Fabrizio Lombardi
- Xiaowei Li
- Dave Towey
- Paolo Tonella
- Salvador Mir
- Arnaud Gotlieb
- Sungho Kang
- Ernesto Sánchez
- Said Hamdioui
- Yves Le Traon
- Ina Schieferdecker
- Rudolf Ramler
Venues
- CoRR
- ITC
- IEEE Access
- Sensors
- IGARSS
- Remote. Sens.
- VTS
- IEEE Trans. Instrum. Meas.
- J. Electron. Test.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICST
- Asian Test Symposium
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- ICST Workshops
- Bioinform.
- IEEE Trans. Software Eng.
- DATE
- Comput. Stat. Data Anal.
- Microelectron. Reliab.
- IEEE Trans. Computers
- Commun. Stat. Simul. Comput.
- NeurIPS
- CVPR
- ICSE
- Softw. Test. Verification Reliab.
- IEEE Des. Test Comput.
- J. Syst. Softw.
- ASE
- ISSTA
- Expert Syst. Appl.
- AAAI
- Inf. Softw. Technol.
- ATS
- ETS
- ICML
- IJCNN
- Neurocomputing
- DAC
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