TEST DATA
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Sudhakar M. Reddy
- Tsong Yueh Chen
- Lionel C. Briand
- Janusz Rajski
- Matteo Sonza Reorda
- Jerzy Tyszer
- Seiji Kajihara
- Gordon Fraser
- Hideo Fujiwara
- Erik Jan Marinissen
- Gregg Rothermel
- Robert M. Hierons
- Alex Orailoglu
- Kwang-Ting Cheng
- T. H. Tse
- Mark Harman
- Atif M. Memon
- Antonia Bertolino
- Xiaoqing Wen
- Abhijit Chatterjee
- Kate Saenko
- Yervant Zorian
- Dimitris Nikolos
- Vishwani D. Agrawal
- Tao Xie
- Dave Towey
- Xiaowei Li
- Fabrizio Lombardi
- Salvador Mir
- Paolo Tonella
- Arnaud Gotlieb
- Said Hamdioui
- Ernesto Sánchez
- Sungho Kang
- Degang Chen
- Nur A. Touba
- Kewal K. Saluja
Venues
- CoRR
- ITC
- IEEE Access
- Sensors
- IGARSS
- Remote. Sens.
- VTS
- IEEE Trans. Instrum. Meas.
- J. Electron. Test.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Asian Test Symposium
- ICST
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- ICST Workshops
- Bioinform.
- IEEE Trans. Software Eng.
- DATE
- Comput. Stat. Data Anal.
- Microelectron. Reliab.
- IEEE Trans. Computers
- Commun. Stat. Simul. Comput.
- CVPR
- NeurIPS
- ICSE
- Softw. Test. Verification Reliab.
- IEEE Des. Test Comput.
- ASE
- J. Syst. Softw.
- ISSTA
- Expert Syst. Appl.
- Inf. Softw. Technol.
- AAAI
- ETS
- ATS
- IJCNN
- ICML
- Neurocomputing
- DAC
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend