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IEEE Des. Test Comput.
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1990
2012
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Publications
volume 29, number 2, 2012
Krishnendu Chakrabarty
Standards, Interoperability, and Innovation in a Disaggregated IC Industry.
IEEE Des. Test Comput.
29 (2) (2012)
Nick English
,
Yatin Trivedi
Standards and Collaboration Perspectives: Yesterday, Today, and Tomorrow [Perspectives].
IEEE Des. Test Comput.
29 (2) (2012)
Nagu R. Dhanwada
,
David J. Hathaway
,
Jerry Frenkil
,
W. Rhett Davis
,
Harun Demircioglu
Leakage Power Contributor Modeling.
IEEE Des. Test Comput.
29 (2) (2012)
Susan Carver
,
Anmol Mathur
,
Lalit Sharma
,
Prasad Subbarao
,
Steve Urish
,
Qi Wang
Low-Power Design Using the Si2 Common Power Format.
IEEE Des. Test Comput.
29 (2) (2012)
Partha Pande
Test Technology TC Newsletter.
IEEE Des. Test Comput.
29 (2) (2012)
Mark Hahn
OpenAccess: Standard and Practices.
IEEE Des. Test Comput.
29 (2) (2012)
volume 29, number 3, 2012
Stan Krolikoski
That's not our job! [Standards].
IEEE Des. Test Comput.
29 (3) (2012)
Silvia Franchini
,
Antonio Gentile
,
Filippo Sorbello
,
Giorgio Vassallo
,
Salvatore Vitabile
Design Space Exploration of Parallel Embedded Architectures for Native Clifford Algebra Operations.
IEEE Des. Test Comput.
29 (3) (2012)
Theocharis Theocharides
Test Technology TC Newsletter.
IEEE Des. Test Comput.
29 (3) (2012)
Satrajit Chatterjee
,
Michael Kishinevsky
,
Ümit Y. Ogras
xMAS: Quick Formal Modeling of Communication Fabrics to Enable Verification.
IEEE Des. Test Comput.
29 (3) (2012)
Alberto L. Sangiovanni-Vincentelli
EDA meets biology! The bumpy road ahead [Perscetives].
IEEE Des. Test Comput.
29 (3) (2012)
Scott Davidson
At the beginning.
IEEE Des. Test Comput.
29 (3) (2012)
Jaydeep P. Bardhan
Fast Solvers for Molecular Science and Engineering.
IEEE Des. Test Comput.
29 (3) (2012)
Michael Jassowski
Organizational Dynamics: Understanding the Impact of Organizational Structure in Team Productivity.
IEEE Des. Test Comput.
29 (3) (2012)
Hua Jiang
,
Marc D. Riedel
,
Keshab K. Parhi
Digital Signal Processing With Molecular Reactions.
IEEE Des. Test Comput.
29 (3) (2012)
Curtis Madsen
,
Chris J. Myers
,
Tyler Patterson
,
Nicholas Roehner
,
Jason T. Stevens
,
Chris Winstead
Design and Test of Genetic Circuits Using ${\tt iBioSim}$iBioSim.
IEEE Des. Test Comput.
29 (3) (2012)
Douglas Densmore
,
Soha Hassoun
Guest Editors' Introduction: Synthetic Biology.
IEEE Des. Test Comput.
29 (3) (2012)
Douglas Densmore
,
Soha Hassoun
Design Automation for Synthetic Biological Systems.
IEEE Des. Test Comput.
29 (3) (2012)
Seetharam Narasimhan
,
Rajat Subhra Chakraborty
,
Swarup Chakraborty
Hardware IP Protection During Evaluation Using Embedded Sequential Trojan.
IEEE Des. Test Comput.
29 (3) (2012)
Krishnendu Chakrabarty
Looking ahead at the role of electronic design automation in synthetic biology [From the EIC].
IEEE Des. Test Comput.
29 (3) (2012)
volume 29, number 4, 2012
Haralampos-G. D. Stratigopoulos
,
Salvador Mir
Adaptive Alternate Analog Test.
IEEE Des. Test Comput.
29 (4) (2012)
Mehdi Maasoumy
,
Alberto L. Sangiovanni-Vincentelli
Total and Peak Energy Consumption Minimization of Building HVAC Systems Using Model Predictive Control.
IEEE Des. Test Comput.
29 (4) (2012)
Mani B. Srivastava
From measurements to sustainable choices [Persepectives].
IEEE Des. Test Comput.
29 (4) (2012)
Mary Ann Piette
,
Jessica Granderson
,
Michael Wetter
,
Sila Kiliccote
Intelligent Building Energy Information and Control Systems for Low-Energy Operations and Optimal Demand Response.
IEEE Des. Test Comput.
29 (4) (2012)
Víctor H. Champac
,
Julio Vazquez Hernandez
,
Salvador Barcelo
,
Roberto Gómez
,
Chuck Hawkins
,
Jaume Segura
Testing of Stuck-Open Faults in Nanometer Technologies.
IEEE Des. Test Comput.
29 (4) (2012)
Yuvraj Agarwal
,
Anand Raghunathan
Guest Editors' Introduction: Green Buildings.
IEEE Des. Test Comput.
29 (4) (2012)
Krishnendu Chakrabarty
Electronic Design Methods and Technologies for Green Buildings.
IEEE Des. Test Comput.
29 (4) (2012)
Partha Pande
Test Technology TC Newsletter.
IEEE Des. Test Comput.
29 (4) (2012)
Stephen Dawson-Haggerty
,
Jorge Ortiz
,
Jason Trager
,
David E. Culler
,
Randy H. Katz
Energy Savings and the "Software-Defined" Building.
IEEE Des. Test Comput.
29 (4) (2012)
Scott Davidson
Energy Efficiency Like Your Momma Used to Make.
IEEE Des. Test Comput.
29 (4) (2012)
Thomas Weng
,
Yuvraj Agarwal
From Buildings to Smart Buildings - Sensing and Actuation to Improve Energy Efficiency.
IEEE Des. Test Comput.
29 (4) (2012)
Jing Zeng
,
Ruifeng Guo
,
Wu-Tung Cheng
,
Michael Mateja
,
Jing Wang
Scan-Based Speed-Path Debug for a Microprocessor.
IEEE Des. Test Comput.
29 (4) (2012)
Stephan Eggersglüß
,
Rolf Drechsler
A Highly Fault-Efficient SAT-Based ATPG Flow.
IEEE Des. Test Comput.
29 (4) (2012)
Yang Yang
,
Qi Zhu
,
Mehdi Maasoumy
,
Alberto L. Sangiovanni-Vincentelli
Development of Building Automation and Control Systems.
IEEE Des. Test Comput.
29 (4) (2012)
Kamin Whitehouse
,
Juhi Ranjan
,
Jiakang Lu
,
Tamim I. Sookoor
,
Mehdi Saadat
,
Carrie Meinberg Burke
,
Galen Staengl
,
Anselmo Canfora
,
Hossein Haj-Hariri
Towards Occupancy-Driven Heating and Cooling.
IEEE Des. Test Comput.
29 (4) (2012)
volume 29, number 5, 2012
Wing Chiu Tam
,
Ronald D. Blanton
Physically-Aware Analysis of Systematic Defects in Integrated Circuits.
IEEE Des. Test Comput.
29 (5) (2012)
Masahiro Ishida
,
Kiyotaka Ichiyama
,
Tasuku Fujibe
,
Daisuke Watanabe
,
Masayuki Kawabata
Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost.
IEEE Des. Test Comput.
29 (5) (2012)
Jackson Pachito
,
Celestino V. Martins
,
Bruno Jacinto
,
Jorge Semião
,
Julio César Vázquez
,
Víctor H. Champac
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection.
IEEE Des. Test Comput.
29 (5) (2012)
Stan Krolikoski
Two Approaches to Handling Late Essential/Necessary Patent Claims Against Standards.
IEEE Des. Test Comput.
29 (5) (2012)
Seetharam Narasimhan
,
Wen Yueh
,
Xinmu Wang
,
Saibal Mukhopadhyay
,
Swarup Bhunia
Improving IC Security Against Trojan Attacks Through Integration of Security Monitors.
IEEE Des. Test Comput.
29 (5) (2012)
Stephen K. Sunter
,
Aubin Roy
Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan.
IEEE Des. Test Comput.
29 (5) (2012)
Bram Kruseman
,
Bratislav Tasic
,
Camelia Hora
,
Jos Dohmen
,
Hamidreza Hashempour
,
Maikel van Beurden
,
Yizi Xing
Defect Oriented Testing for Analog/Mixed-Signal Designs.
IEEE Des. Test Comput.
29 (5) (2012)
John Keane
,
Chris H. Kim
,
Qunzeng Liu
,
Sachin S. Sapatnekar
Process and Reliability Sensors for Nanoscale CMOS.
IEEE Des. Test Comput.
29 (5) (2012)
Min Chen
,
Vijay Reddy
,
Srikanth Krishnan
,
Venkatesh Srinivasan
,
Yu Cao
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors.
IEEE Des. Test Comput.
29 (5) (2012)
M. Kamm
,
H. Jun
,
L. Boluna
SerDes Interoperability and Optimization.
IEEE Des. Test Comput.
29 (5) (2012)
volume 29, number 6, 2012
Theo Theocharides
Test Technology TC Newsletter.
IEEE Des. Test Comput.
29 (6) (2012)
Erik Jan Marinissen
Pioneering in Asia With the US Venture Capital Model.
IEEE Des. Test Comput.
29 (6) (2012)
Krishnendu Chakrabarty
Towards more digital content in wireless systems [From the EiC].
IEEE Des. Test Comput.
29 (6) (2012)
Haralampos-G. D. Stratigopoulos
,
Alberto Valdes-Garcia
Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers.
IEEE Des. Test Comput.
29 (6) (2012)
Andrew B. Kahng
Predicting the future of information technology and society [The Road Ahead].
IEEE Des. Test Comput.
29 (6) (2012)