Srikanth Krishnan

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 11

Top Topics

Multimedia Retrieval

Kalman Filtering

Top Venues

Publications

Hariram Mohanram, Harikrishnan Kumarasamy, Choong-Un Kim, Young-Joon Park, Srikanth Krishnan
Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current. IRPS (2024)
Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. IRPS (2022)
Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. IRPS (2021)
Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. IRPS (2020)
Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. IRPS (2020)
Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. IRPS (2019)
Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan
Current Crowding Impact on Electromigration in Al Interconnects. IRPS (2019)
Ethan S. Lee, Luis Hurtado, Jungwoo Joh, Srikanth Krishnan, Sameer Pendharkar, Jesús A. del Alamo
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs. IRPS (2019)
Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain
Cross-Modal Health State Estimation. CoRR (2018)
SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. IRPS (2018)
Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain
Cross-Modal Health State Estimation. ACM Multimedia (2018)
Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao
ACE: A robust variability and aging sensor for high-k/metal gate SoC. ESSDERC (2013)
Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors. IEEE Des. Test Comput. 29 (5) (2012)
Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
Circuit aging prediction for low-power operation. CICC (2009)
Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao
Statistical prediction of circuit aging under process variations. CICC (2008)
Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. CICC (2007)
Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan
Impact of negative bias temperature instability on digital circuit reliability. Microelectron. Reliab. 45 (1) (2005)