Gyusung Park

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 6

Top Topics

Reliability Assessment

Top Venues

Publications

Daeyeon Kim, Yusung Kim, Ayush Shrivastava, Gyusung Park, Anandkumar Mahadevan Pillai, Kunal Bannore, Tri Doan, Muktadir Rahman, Gwanghyeon Baek, Clifford Ong, Xiaofei Wang, Zheng Guo, Eric Karl
15.2 A 2048x60m4 SRAM Design in Intel 4 with an Around-the-Array Power-Delivery Scheme Using PowerVia. ISSCC (2024)
Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim
An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. IRPS (2021)
Hanzhao Yu, Gyusung Park, Chris H. Kim
Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. ESSCIRC (2021)
Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. IRPS (2019)
Gyusung Park, Minsu Kim, Nakul Pande, Po-Wei Chiu, Jeehwan Song, Chris H. Kim
A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. CICC (2019)
Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy
All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. IRPS (2018)