RELIABILITY ASSESSMENT
Experts
- Shigeru Yamada
- Chanan Singh
- Enrico Zio
- Hong-Zhong Huang
- Tadashi Dohi
- Yi Ding
- Yoshinobu Tamura
- Shinji Inoue
- Luigi Vanfretti
- Yi-Kuei Lin
- Mahmud Fotuhi-Firuzabad
- Dimitris Gizopoulos
- Yan-Fu Li
- Jean-François Naviner
- Mohammad Shahidehpour
- Yu Liu
- Fevzi Belli
- Frede Blaabjerg
- Michael G. Pecht
- Sheng Lei
- Nan Duan
- Kai Sun
- Jianting Zhou
- Ben Kaczer
- David W. Coit
- Jason I. Brown
- Matteo Sonza Reorda
- Guido Groeseneken
- Jörg Henkel
- Enrique López Droguett
- Roberto Pietrantuono
- Sotiris Tselonis
- Shu-Li Zhao
- Taotao Zhou
- Ali Mosleh
- Jinhua Mi
- Dhiraj K. Pradhan
- Rafael Castro-López
- Maksim Jenihhin
Venues
- Reliab. Eng. Syst. Saf.
- CoRR
- Microelectron. Reliab.
- IEEE Access
- IEEE Trans. Ind. Electron.
- IRPS
- IEEE Trans. Reliab.
- IECON
- Sensors
- IEEE Trans. Smart Grid
- Qual. Reliab. Eng. Int.
- ISGT Europe
- ISCAS
- IEEE Trans. Instrum. Meas.
- PSCC
- WSC
- ICSRS
- HICSS
- IAS
- ISIE
- ISGT
- Int. J. Syst. Assur. Eng. Manag.
- ITC
- IEEE Trans. Very Large Scale Integr. Syst.
- Proc. IEEE
- ISGT-Europe
- Comput. Aided Civ. Infrastructure Eng.
- Complex.
- IEEM
- ICIT
- IEEE Trans. Ind. Informatics
- ISSRE
- DATE
- EUROCON
- J. Comput. Civ. Eng.
- IEEE Syst. J.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Comput. Ind. Eng.
- Expert Syst. Appl.
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