RELIABILITY ASSESSMENT
Experts
- Shigeru Yamada
- Enrico Zio
- Chanan Singh
- Yi Ding
- Hong-Zhong Huang
- Tadashi Dohi
- Shinji Inoue
- Yoshinobu Tamura
- Yan-Fu Li
- Yi-Kuei Lin
- Mahmud Fotuhi-Firuzabad
- Luigi Vanfretti
- Dimitris Gizopoulos
- Fevzi Belli
- Jean-François Naviner
- Michael G. Pecht
- Mohammad Shahidehpour
- Frede Blaabjerg
- Yu Liu
- Jason I. Brown
- Kai Sun
- Guido Groeseneken
- Sheng Lei
- Jianting Zhou
- David W. Coit
- Enrique López Droguett
- Nan Duan
- Jörg Henkel
- Ben Kaczer
- Matteo Sonza Reorda
- Elisenda Roca
- Kofi A. A. Makinwa
- Branislav Hredzak
- Marita Blank
- Charles J. Colbourn
- Josep Pou
- Alberto Bosio
- Om Prakash Yadav
- Patrick Panciatici
Venues
- Reliab. Eng. Syst. Saf.
- CoRR
- Microelectron. Reliab.
- IEEE Access
- IEEE Trans. Ind. Electron.
- IRPS
- IEEE Trans. Reliab.
- Sensors
- IECON
- Qual. Reliab. Eng. Int.
- IEEE Trans. Smart Grid
- ISGT Europe
- ISCAS
- IEEE Trans. Instrum. Meas.
- PSCC
- WSC
- HICSS
- ICSRS
- ISGT
- IAS
- ISIE
- Comput. Aided Civ. Infrastructure Eng.
- Int. J. Syst. Assur. Eng. Manag.
- ITC
- IEEE Trans. Very Large Scale Integr. Syst.
- Expert Syst. Appl.
- Proc. IEEE
- ISGT-Europe
- ICIT
- Complex.
- DATE
- IEEE Trans. Ind. Informatics
- ISSRE
- IEEM
- IEEE Syst. J.
- J. Comput. Civ. Eng.
- Comput. Ind. Eng.
- EUROCON
- Symmetry
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