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Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers.

Hanzhao YuGyusung ParkChris H. Kim
Published in: ESSCIRC (2021)
Keyphrases
  • low cost
  • random sampling
  • high density
  • real time
  • energy saving
  • high speed
  • programmable logic
  • high power
  • neural network
  • dynamic range
  • extreme values