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All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits.

Gyusung ParkMinsu KimChris H. KimBongjin KimVijay Reddy
Published in: IRPS (2018)
Keyphrases
  • circuit design
  • analog vlsi
  • high speed
  • real time
  • mixed signal
  • phase locked loop
  • low cost
  • digital media
  • chip design
  • evolutionary algorithm
  • cloud computing
  • monitoring system
  • single chip