Login / Signup

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing.

Gyusung ParkMinsu KimNakul PandePo-Wei ChiuJeehwan SongChris H. Kim
Published in: CICC (2019)
Keyphrases
  • software reliability
  • sigma delta
  • high speed
  • electronic circuits
  • data sets
  • data acquisition
  • real time
  • neural network
  • search engine
  • video sequences
  • reliability analysis
  • reliability assessment