RELIABILITY ANALYSIS
Experts
- Liudong Xing
- Kishor S. Trivedi
- Rui Kang
- Hong-Zhong Huang
- Osman Hasan
- Enrico Zio
- Swapna S. Gokhale
- Sofiène Tahar
- Deng-Jyi Chen
- Jürgen Teich
- Robert J. Wood
- Zhenzhou Lu
- Lorenzo Ciani
- Lirida A. B. Naviner
- Jianwen Xiang
- Vitaly G. Levashenko
- Michael Glaß
- Serkan Eryilmaz
- Hussam Amrouch
- Lirong Cui
- Sankaran Mahadevan
- Stefan Wagner
- Shuming Zhou
- Chin-Yu Huang
- Gregory Levitin
- Zhili Sun
- Jörg Henkel
- Marcantonio Catelani
- Siwei Zhou
- Jian Wang
- Miroslav Kvassay
- Min Xie
- Min-Sheng Lin
- Michael R. Lyu
- David Z. Pan
- Liang Gao
- Jason I. Brown
- Michael Beer
- Way Kuo
Venues
- Reliab. Eng. Syst. Saf.
- CoRR
- Microelectron. Reliab.
- Qual. Reliab. Eng. Int.
- IEEE Trans. Reliab.
- IEEE Access
- IRPS
- Sensors
- DATE
- Int. J. Syst. Assur. Eng. Manag.
- IEEE Trans. Computers
- SAFECOMP
- ICSRS
- Comput. Ind. Eng.
- Networks
- ACC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Eur. J. Oper. Res.
- IROS
- ISSRE
- Appl. Math. Comput.
- ISQED
- ICRA
- Symmetry
- IEEE Trans. Very Large Scale Integr. Syst.
- IECON
- Eng. Comput.
- DAC
- Ann. Oper. Res.
- J. Intell. Fuzzy Syst.
- Technometrics
- Entropy
- Expert Syst. Appl.
- Inf. Sci.
- IEEE Trans. Software Eng.
- IEEE Trans. Ind. Electron.
- IEEM
- ISIT
- IEEE Trans. Inf. Theory
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